The properties of
half-metallic manganite thin films depend on
the composition and structure in the atomic scale, and consequently,
their potential functional behavior can only be based on fine structure
characterization. By combining advanced transmission electron microscopy,
electron energy loss spectroscopy, density functional theory calculations,
and multislice image simulations, we obtained evidence of a 7 nm-thick
interface layer in La0.7Sr0.3MnO3 (LSMO) thin films, compatible with the formation of well-known dead
layers in manganites, with an elongated out-of-plane lattice parameter
and structural and electronic properties well distinguished from the
bulk of the film. We observed, for the first time, a structural shift
of Mn ions coupled with oxygen vacancies and a reduced Mn valence
state within such layer. Understanding the correlation between oxygen
vacancies, the Mn oxidation state, and Mn-ion displacements is a prerequisite
to engineer the magnetotransport properties of LSMO thin films.