P‐13.3: The Analysis and Improvement of Dim Dark Line Caused By Vth Drift in AMOLED Full Contact Test

Abstract

In this paper we investigated the dim dark line in AMOLED full contact test. The influence of EL aging and Vth drift were analyzed and compared, and the conclusion that Vth drift was the main reason which caused the dim dark line was achived. We also provided a solution that connecting the ESD ring to the ESD line in low voltage instead of connecting it to the VDD line in high voltage, and the dim dark line was eliminated effectively.