2013
DOI: 10.1002/j.2168-0159.2013.tb06391.x
|View full text |Cite
|
Sign up to set email alerts
|

P.5: High Uniformity Solid Phase Crystallized Bridged‐Grain Polycrystalline Silicon Thin Film Transistors

Abstract: Solid phase crystallized poly‐Si TFT with Al2O3 gate dielectric and bridged grain structure is demonstrated. The results show dramatically improved threshold voltage, subthreshold swing and on‐off ratio with very high uniformity. The proposed device is promising for application in AMOLED pixel circuits with simple design and low cost.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 15 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?