2016
DOI: 10.1002/adma.201506472
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p‐Type MoS2 and n‐Type ZnO Diode and Its Performance Enhancement by the Piezophototronic Effect

Abstract: A plasma-induced p-type MoS2 flake and n-type ZnO film diode, which exhibits an excellent rectification ratio, is demonstrated. Under 365 nm optical irradiation, this p-n diode shows a strong photoresponse with an external quantum efficiency of 52.7% and a response time of 66 ms. By increasing the pressure on the junction to 23 MPa, the photocurrent can be enhanced by a factor of four through the piezophototronic effect.

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Cited by 156 publications
(136 citation statements)
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“…As a consequence, the devices exhibit a maximum responsivity as high as 2.3 × 10 4 A W −1 under −0.38% compressive strain, which represents a 26‐fold improvement over the highest value for previously reported single‐layer MoS 2 ‐based photodetectors. Piezo‐phototronic effect has also been employed to enhance the photoresponse of devices based on 2D MoS 2 flake/ZnO film and MoS 2 flake/CuO film vertical heterojunctions, as well as MoS 2 /rGO heterostructures . Upon external mechanical strain, the maximum responsivities of these devices can be enhanced by several to tens of times, which is attributed to the adjusted band structure at the heterojunction interface as well as the broadened depletion region induced by the piezo‐potential.…”
Section: D Layered Materials‐based Flexible Photodetectorsmentioning
confidence: 99%
“…As a consequence, the devices exhibit a maximum responsivity as high as 2.3 × 10 4 A W −1 under −0.38% compressive strain, which represents a 26‐fold improvement over the highest value for previously reported single‐layer MoS 2 ‐based photodetectors. Piezo‐phototronic effect has also been employed to enhance the photoresponse of devices based on 2D MoS 2 flake/ZnO film and MoS 2 flake/CuO film vertical heterojunctions, as well as MoS 2 /rGO heterostructures . Upon external mechanical strain, the maximum responsivities of these devices can be enhanced by several to tens of times, which is attributed to the adjusted band structure at the heterojunction interface as well as the broadened depletion region induced by the piezo‐potential.…”
Section: D Layered Materials‐based Flexible Photodetectorsmentioning
confidence: 99%
“…The absence of high quality p–n junctions also limits the performance of the MoS 2 based devices. Although photodetectors based on mono/multilayer MoS 2 heterostructure have shown excellent device characteristics in terms of high sensitivity (up to 7 A/W) and wide band response26272829 their applicability still suffers due to complex fabrication process.…”
mentioning
confidence: 99%
“…Xue et al fabricated a p-MoS 2 and an n-ZnO diode and measured its photoresponse performance under different pressures [55]. MoS 2 is pretreated by SF 6 to become p-type and acrylic is used to apply a pressure and simultaneously transmit the ultraviolet.…”
Section: D Semiconductors/conventional Piezoelectric Oxide Heterostrmentioning
confidence: 99%