2006
DOI: 10.1103/physrevlett.96.039704
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Paillet, Poncharal, and Zahab Reply:

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Cited by 27 publications
(46 citation statements)
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“…[7] to the experimental results in Ref. [8,21] shows that the theoretical values of the LO-phonons in semiconducting tubes underestimate the experimental values by ≈10 cm −1 . Therefore we can assign the peaks at 1590 cm −1 and 1581 cm −1 of to the LO and the TO phonon of the semiconducting nanotube.…”
mentioning
confidence: 53%
“…[7] to the experimental results in Ref. [8,21] shows that the theoretical values of the LO-phonons in semiconducting tubes underestimate the experimental values by ≈10 cm −1 . Therefore we can assign the peaks at 1590 cm −1 and 1581 cm −1 of to the LO and the TO phonon of the semiconducting nanotube.…”
mentioning
confidence: 53%
“…Current understanding of the photophysical properties of semiconducting carbon nanotubes [2 -7] are based mostly on experimental results for the first (E S 11 ) and second (E S 22 ) optical transitions (S superscript stands for semiconducting, while M will be used for metallic tubes), based on a set of fewer than 40 SWNTs (characterized by their (n, m) indices [1]) in the diameter range from 0.7 to 1.3 nm [8][9][10][11][12][13]. Efforts have been made to extend these results to larger diameter tubes, and to establish the third (E S 33 ) and fourth (E S 44 ) transitions [14,15]. E S 33 and E S 44 are important for the optics of large diameter semiconducting single-wall carbon nanotubes (SWNTs), since for d t > 1:3 nm, E S 22 is already in the infrared range [8][9][10][11].…”
mentioning
confidence: 99%
“…The crucial issue here is to go beyond plane capacitor geometry models, 12 which are by essence restricted to semiquantitative estimations. Truly quantitative charge measurements are obtained as follows.…”
mentioning
confidence: 99%
“…1͑a͔͒. [12][13][14] After injection, the CNT charge state is then measured by electrostatic force microscopy ͑EFM͒. In this process, the tip is lifted at a distance z Ӎ 100 nm above the sample surface to discard short-range surface forces, and the cantilever resonance frequency shifts are recorded as a probe of electrostatic force gradients acting on the tip biased at a detection voltage V EFM ͓Fig.…”
mentioning
confidence: 99%