Parallelization of an algorithm used to simulate Atomic Force Microscope images

Bigeard, R.; Devel, M.; Julliand, Jacques

doi:10.1007/bfb0031591

Search citation statements

Order By: Relevance

Paper Sections

Select...

Discussion1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

1998

Publication Types

Select...

Article1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

(1 citation statement)

References 5 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The difficulty of defining heights in the latter mode has been pointed out and the influence of the chemical nature of the substrate has been demonstrated. Finally, we note en passant that the numerical code can be easily adapted to parallel computations [35] and we insist on the versatility of this algorithm that can be used with any shape of tips and of nanostructures. Another point is that a time-resolved simulation of the dynamical mode could be performed with the present model, by including the three-dimensional force calculated with our model in a Verlet algorithm.…”

Section: Discussionmentioning

confidence: 99%

Image simulation of a corrugated surface in the constant-force-gradient mode of the scanning force microscope

Touhari-Kouko

Bouju

Devel

et al. 1998

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

A simple numerical method allowing one to simulate the imaging process in the non-contact mode of the scanning force microscope in the case of a pyramidal tip interacting with a corrugated surface is presented. The attractive van der Waals and repulsive forces are described by a Lennard-Jones-type potential in order to study the image of nanostructures in the constant-height and constant-force-gradient modes. The influence of the tip's shape is demonstrated and the notion of resolution is discussed for both modes. We also analyse the consequences of the chemical natures of the nanostructures and the substrate for the image.

show abstract

Section: Discussionmentioning

confidence: 99%