Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients

Sindia, Suraj; Agrawal, Vishwani D.; Singh, Virendra

doi:10.1007/s10836-012-5326-z

Cited by 15 publications

(12 citation statements)

References 12 publications

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“…Our initial experiments on a sample of 400 low noise amplifier [25], [27], [29] circuits show promising Paper PTF1…”

Section: B Preliminary Experimentsmentioning

confidence: 92%

“…Section VI outlines the method of fault diagnosis using the proposed method. Sections VII and VIII introduce another type of signature, namely, probability moments and sensitivity enhancement of signatures by V-transform, respectively, that are described in detail elsewhere [24], [27]. An adaptive framework that leverages on the proposed circuit signatures is discussed in IX.…”

Section: International Test Conferencementioning

confidence: 99%

“…We also propose a scheme to distinguish between circuit specifications failures due to process variation versus manufacturing defects which manifest as parametric faults in [22]. A complete description of the V-transform and its application on example circuits such as elliptic filter and low noise amplifier is presented in [23], [27]. Our work in [26], [28] computes a bound on the achievable defect level and fault coverage in coefficient based parametric fault test schemes such as the above.…”

Section: V-transform As a Circuit Signaturementioning

confidence: 99%

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High sensitivity test signatures for unconventional analog circuit test paradigms

Sindia

Agrawal

2013

2013 IEEE International Test Conference (ITC)

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Abstract-A method of testing for parametric faults in analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the root mean square (RMS) magnitude of the applied input voltage at a relevant frequency or DC. The test then classifies the CUT as fault-free or faulty based upon a comparison of the estimated polynomial coefficients with those of the fault-free circuit. The test application needs very little augmentation of the circuit to make it testable as only output parameters are used for classification. The method is validated on an active elliptic filter and is shown to uncover parametric faults causing deviations as small as 5% from nominal values. Fault diagnosis based upon sensitivity of polynomial coefficients at relevant frequencies is discussed. Another type of circuit signatures in the form of probability moments of the output when test input is random noise are also proposed. It is shown that the sensitivity of either signature can be enhanced by a newly proposed nonlinear Vtransform. Finally, an adaptive test framework leveraging from these signatures and the transform technique is shown to improve defect level and yield loss.

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“…Our initial experiments on a sample of 400 low noise amplifier [25], [27], [29] circuits show promising Paper PTF1…”

Section: B Preliminary Experimentsmentioning

confidence: 92%

Section: International Test Conferencementioning

confidence: 99%

Section: V-transform As a Circuit Signaturementioning

confidence: 99%

See 1 more Smart Citation

High sensitivity test signatures for unconventional analog circuit test paradigms

Sindia

Agrawal

2013

2013 IEEE International Test Conference (ITC)

Self Cite

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“…All the tables have been obtained after discarding redundant rows. In the case specified by Table 11 the tests leading to five equations can be arranged using the current supply sources of the set B (13) and measuring the voltages at five nodes from among the nodes 13, 14, 15, 16, 17, 18.…”

Section: Examplementioning

confidence: 99%

“…They exploit various concepts and techniques, e.g. neural networks [1], linear programming [20], fuzzy approach [3,25], wavelet transform [2], frequency response function [11,23], support vector machine [10,12], V-transform of polynomial coefficients [13], evolutionary algorithm [7], Volterra series [4], block relaxation method [16]. Several papers have been devoted to soft fault diagnosis of the process parameters in analog integrated circuits, e.g.…”

Section: Introductionmentioning

confidence: 99%

A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC Circuits

Tadeusiewicz

Hałgas

2017

J Electron Test

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The paper deals with multiple soft fault diagnosis of linear analog circuits. The basic problem of arranging diagnostic tests performed in DC or AC states is considered in detail. A systematic method is developed that allows finding values of the sources applied to the excitation nodes as well as the measurement nodes at which the voltage variations due to the parameter deviations are sufficiently large. For this purpose the sensitivity analysis and the nonlinear programming technique, with appropriate objective function and constraints, are used. Four numerical examples reveal effectiveness of the proposed method for arranging the diagnostic tests.

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Soft Fault Diagnosis of Analog Circuits via Frequency Response Function Measurements

Xie

et al. 2014

J Electron Test

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Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients

Cited by 15 publications

References 12 publications

High sensitivity test signatures for unconventional analog circuit test paradigms

High sensitivity test signatures for unconventional analog circuit test paradigms

A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC Circuits

Soft Fault Diagnosis of Analog Circuits via Frequency Response Function Measurements

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