2020
DOI: 10.1109/tdmr.2020.2985209
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Parametric Study on the Void Risk in FC-POP Molded Underfill Process Using a Novel Porous Media, Two-Phase, Compressible Flow Simulation Method

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Cited by 3 publications
(2 citation statements)
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“…Many attempts have been made to minimize and eliminate the void defects. Vacuum moulded underfill was applied to the flip-chip package underfill process [12]. The simulation model predicts the void size and its characteristics via computational fluid dynamics [11 & 12] in the Flip-chip PoP.…”
Section: Introductionmentioning
confidence: 99%
“…Many attempts have been made to minimize and eliminate the void defects. Vacuum moulded underfill was applied to the flip-chip package underfill process [12]. The simulation model predicts the void size and its characteristics via computational fluid dynamics [11 & 12] in the Flip-chip PoP.…”
Section: Introductionmentioning
confidence: 99%
“…Subsequently, the underfill flow in the package was modelled numerically (Ishak et al, 2020;Nashrudin et al, 2020), experimentally (Huang et al, 2020) or analytically (Ng et al, 2020). The void defect formed during the underfilling flow was also numerically simulated (Lee et al, 2020). Moreover, the curing stage was studied numerically to predict the package warpage (Lin and Lee, 2020).…”
Section: Introductionmentioning
confidence: 99%