Parametric testing of mixed-signal circuits by ANN processing of transient responses

Materka, Andrzej; Strzelecki, Michał

doi:10.1007/bf00137574

Cited by 13 publications

(5 citation statements)

References 13 publications

(23 reference statements)

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“…The first significant research of verification techniques using ANN was witness in 1996 by Materka [34]. The author has used feedforward neural network to evaluate the circuit parameters.…”

Section: Prominent Studiesmentioning

confidence: 99%

Research Trends in Formal Verification Process for Analog and Mixed Signal Design

S¹,

Manjunath²

2015

IJCA

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Formal verification is one of the crucial stages of design phase that ensure the preciseness of the circuit design and its corresponding behavior with respect to specific system design. From last decade, there has been an abundant formal verification techniques introduced by the research community for analog and mixed signal circuits that used as an interface between analog and digital components. Owing to the maximized sophistication, and shrinking sizes of chip, analog, and mixed signal verification is encountering challenges in increasing verification requirement that calls for analyzing the prior techniques. The prime purpose of this paper is to discuss the most standard models, and techniques introduced till date and to excavate the various facts about their effectiveness in the area circuit design principles. The paper also discusses some of the critical research gaps explored from the study.

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“…The first significant research of verification techniques using ANN was witness in 1996 by Materka [34]. The author has used feedforward neural network to evaluate the circuit parameters.…”

Section: Prominent Studiesmentioning

confidence: 99%

Research Trends in Formal Verification Process for Analog and Mixed Signal Design

S¹,

Manjunath²

2015

IJCA

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“…A wide variety of concepts, methods, and techniques have been developed for soft fault diagnosis of analogue circuits, e.g. : the Woodbury formula for matrix theory [27], support vector machine [20,25], linear programming [28], neural networks [1,12,16,21], fuzzy logic approach [4,13], wavelet transforms [1,3], frequency response function [22], V-transform of polynomial coeffi-Article history: received on Oct. 05, 2017; accepted on Jan. 30,2018; available online on Jun. 30, 2018, DOI: 10.24425/119558.…”

Section: Introductionmentioning

confidence: 99%

Metrology and Measurement Systems

Tadeusiewicz¹,

Hałgas²

2018

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The paper deals with multiple soft fault diagnosis of analogue circuits. A method for diagnosis of linear circuits is developed, belonging to the class of the fault verification techniques. The method employs a measurement test performed in the frequency domain, leading to the nonlinear least squares problem. To solve this problem the Powell minimization method is applied. The diagnostic method is adapted to real circumstances, taking into account deviations of fault-free parameters and measurement uncertainty. Two examples of electronic circuits encountered in practice demonstrate that the method is efficient for diagnosis of middle-sized circuits. Although the method is dedicated to linear circuits it can be adapted to multiple soft fault diagnosis of nonlinear ones. It is illustrated by an example of a CMOS circuit designed in a sub-micrometre technology.

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“…During the last decades a wide variety of methods, concepts and techniques have been adapted to soft fault diagnosis, e.g. the Woodbury formula in matrix theory [24][25], support vector machine [15], [20], linear programming [26], homotopy method [27], fuzzy approach [3], wavelet transform [1][2], neural networks [1], [12], [16], frequency response function [11], [17], V-transform of polynomial coefficients [21], evolutionary algorithm [12], Volterra series [7]. Recently several papers have been focused on multiple soft fault diagnosis in analog integrated circuits designed in micrometer and submicrometer technology, e.g.…”

Section: Introductionmentioning

confidence: 99%

International Journal of Electronics and Telecommunications

Tadeusiewicz

Ossowski

2018

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The paper deals with multiple soft fault diagnosis of linear analog circuits. A fault verification method is developed that allows estimating the values of a set of the parameters considered as potentially faulty. The method exploits the transmittance of the circuit and is based on a diagnostic test leading to output signal in discrete form. Applying Z-transform a diagnostic equation is written which is next reproduced. The obtained system of equations consisting of larger number of equations than the number of the parameters is solved using appropriate numerical approach. The method is adapted to real circumstances taking into account scattering of the fault-free parameters within their tolerance ranges and some errors produced by the method. In consequence, the results provided by the method have the form of ranges including the values of the tested parameters. To illustrate the method two examples of real electronic circuits are given.

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Parametric testing of mixed-signal circuits by ANN processing of transient responses

Cited by 13 publications

References 13 publications

Research Trends in Formal Verification Process for Analog and Mixed Signal Design

Research Trends in Formal Verification Process for Analog and Mixed Signal Design

Metrology and Measurement Systems

International Journal of Electronics and Telecommunications

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