PARPLE: Detailed automatized and parallel evaluation of luminescence mappings

Sträter, Hendrik

doi:10.1016/j.cpc.2015.03.017

Cited by 1 publication

(1 citation statement)

References 17 publications

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“…The evaluation of the QFL‐splitting and absorption has been performed by using piece‐wise linear fits of the high‐energy regime and neglecting unphysical results of the Bose‐term. To parallelize and automatize this operation for all spectra, the open source command line tool PARPLE (Parallel PL evaluation) has been used. From each recorded spectrum, we calculated the integrated PL yield of the band‐to‐band transition, the slope of the high‐energy wing (Bose‐term), the QFL‐splitting

μ

, the optical band gap

E_{g}

, the sub‐gap defect absorption

A_{def}

, and the energetic position of the PL maximum peak

E_{\max}

as function of

η

.…”

Section: Resultsmentioning

confidence: 99%

Avoiding arbitrarily wrong microluminescence statistics due to a non-quantitatively calibrated setup

Sträter

Nilius

Brüggemann

2017

Phys. Status Solidi B

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Photoluminescence (PL) measurements on the normalμm scale are a powerful tool to examine thin film semiconductors with respect to lateral inhomogeneities of their opto‐electronic properties. For practical reasons, the determination of the standard deviation of the laterally resolved splitting of quasi‐Fermi levels (QFL) is often performed with an experimental setup that only has been calibrated spectrally but not with respect to the quantitatively emitted photon flux. We show that the omission of the absolute PL photon flux can lead to arbitrarily wrong distributions of the QFL‐splitting and correlations between the QFL‐splitting and other opto‐electronic properties. For a better understanding, we present a algebraical formalism of the dependence on the absolute calibration and demonstrate the effect of a wrong calibration using two different thin film absorbers. Finally, a method to estimate the true statistics with sufficient accuracy is presented.

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