To cite this paper: Hussain, M., M.A. Khan, M. Hussain, N. Javed and I. Khaliq, 2015. Application of phenotypic and molecular markers to combine genes for durable resistance against rust virulences and high yield potential in wheat.
AbstractIn order to combine genes for enhancing rust resistance and high yield potential in wheat, parent lines were selected for hybridization on the basis of slow rusting history and phenotypic characters for durable resistance. The hybridized germplasm was advanced in filial generations from F 1 to F 5 . Total 750 head rows were planted in F 6 from selected heads among F 5 generation. From 750 single head rows planted in Kaghan, 345 lines were selected on the basis of agronomic traits and rust resistance; two hundred and twenty lines were selected for high yield and rust resistance performance and evaluated for the presence of durable rust resistant genes with molecular markers. It was confirmed that the lines showing durable rust resistance possessed Lr34/Yr18, Lr46/Yr29 and Sr2/Yr30 genes in combination or individuals from these lines. The results indicated that the most prominent lines i.e., V-11211, V-11212, V-11218, V-11227, V-11262, V-11288, V-11296, V-11304, V-11308, V-11319, V-11338, V-11353, V-11365 and V-11396 showed the combination of three designated slow rusting genes. These lines were high yielding with better resistance than all existing approved wheat varieties of the country. None of these lines had complete resistance, but were of slow rusting type and were suitable for commercial cultivation. These results will be useful for wheat breeders and pathologists of the country in planning of future hybridization program.