2005
DOI: 10.2514/1.12512
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Partially Coherent Spectral Transmittance of Dielectric Thin Films with Rough Surfaces

Abstract: The effects of scattering and partial coherence on the transmittance of thin films with rough surfaces are investigated. For the rough side, the rms roughness is between 0.3 and 0.7 µm, whereas the autocorrelation length ranges from 1 to 36 µm. Scalar scattering theory (SST) is used to account for the scattering losses in the specular direction due to surface roughness, and then the calculated transmittance is spectrally averaged over the coherence spectral width. The spectral averaging method takes into consi… Show more

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Cited by 25 publications
(6 citation statements)
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“…However, in order to account for reflection losses due to the soil roughness that is expected in a realistic scattering scenario, the modified Fresnel coefficients can be used. A scattering loss factor L S [21]…”
Section: B Dihedral Scattering Mechanismsmentioning
confidence: 99%
“…However, in order to account for reflection losses due to the soil roughness that is expected in a realistic scattering scenario, the modified Fresnel coefficients can be used. A scattering loss factor L S [21]…”
Section: B Dihedral Scattering Mechanismsmentioning
confidence: 99%
“…A refractive index in the range of 3.42-3.6 and an extinction coefficient of 10 −6 were calculated for Si using the reflectance spectrum, with a standard error of estimate (SEE) of 0.7% between the experimental and theoretical data obtained using the spectral averaging approach. [9,31] Subsequently, we characterized the graphene and its Raman spectrum, as illustrated in Figure 2a. Since the D peak originates from the breathing modes of sp 2 atoms and activation requires a defect, [32,33] the low intensity of D peak reveals small lattice defects.…”
Section: Sample Fabrication and Characterizationmentioning
confidence: 99%
“…We estimate the gap distance d by minimizing the SEE of measured and theoretical R curves through the genetic algorithm. [9,31] The red and blue solid curves in Figure 2c are theoretical fittings with uncertain bounds of d ± 20 nm, while the black dashed lines represent the reflectance spectra of the sample measured by FTIR. The 11° combined transmission and specular reflection accessory (Bruker, A510/Q-T) was used in the reflectance measurement, in which the aperture was set to 4 mm.…”
Section: Sample Fabrication and Characterizationmentioning
confidence: 99%
“…They show the different dependencies on the Fresnel coefficients (R Hs , R Ht , R Vs , R Vt ), the rotation limit angle (θ 1 ) indicating the roughness-induced depolarization, the roughness intensity loss factor (L SXD ) and the differential phase angle (φ). From Equation (16), it is clear that the L SXD -factor is obsolete, if a ratio of the coherency matrix elements is taken for analysis.…”
Section: Rank 3 Extended Fresnel Scatteringmentioning
confidence: 99%
“…Thus, the loss due to scattering at the soil plane is considered by a scattering loss factor L S [11,16]:…”
Section: Introductionmentioning
confidence: 99%