Particle deposition in confined vessels

Abstract

This paper considers the case of "free" (unattached) particles confined within non-hermetic electronics components, assemblies or units on spacecraft. A methodology is developed for predicting the probability of particle deposition events, especially in areas where the risk for degradation or failure of the spacecraft is high. The effects of high vacuum and microgravity on particle transport processes and particle-wall interactions are discussed. The focus is on solid particles larger than about 1 mil (25 µm), as these particles pose the greatest threat to electronics reliability.