2020
DOI: 10.1088/1402-4896/abcbca
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Particle microscopy by surface plasmon polariton waves at the interface of dielectric and silver silica nano-composites

Abstract: The dielectric tensor of four level atomic medium coupled with dielectric function of silver silica nano-composites material to modify dispersion relation of surface plasmon polaritons (SPPs). The rapid damping of SPPs is used to localized atomic particles in two dimension inverse position space. Directions, phases and intensity of the control field play important roles in the localization of atoms in a unit wavelength domain. Ten, six, four and two localization peaks are investigated by SPPs damping in differ… Show more

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Cited by 13 publications
(3 citation statements)
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“…2 The external fields are tuned to their angular frequencies and atomic state resonance frequencies as: ∆ 1 = ω 12 − ω 1 , ∆ 2 = ω 14 − ω 2 , ∆ p = ω 35 − ω p and ∆ m = ω 13 − ω m of the system. The following Von-Neumann equation of density matrix is to measure coherence between two states [29][30][31]:…”
Section: Dynamics Of the Systemmentioning
confidence: 99%
“…2 The external fields are tuned to their angular frequencies and atomic state resonance frequencies as: ∆ 1 = ω 12 − ω 1 , ∆ 2 = ω 14 − ω 2 , ∆ p = ω 35 − ω p and ∆ m = ω 13 − ω m of the system. The following Von-Neumann equation of density matrix is to measure coherence between two states [29][30][31]:…”
Section: Dynamics Of the Systemmentioning
confidence: 99%
“…Using the following integral transform equation, we can solve the coupled equation in matrix form [58][59][60]:…”
Section: M Nmentioning
confidence: 99%
“…Atom microscopy refers to the precise measurement of the position of an atom [1]. Recent studies have focused on achieving coherent control of the location of an atom, given its applications in various fields.…”
Section: Introductionmentioning
confidence: 99%