Particle-size, size distribution and dislocations in nanocrystalline tungsten-carbide

Ungár, Tamás; Borbély, András; Goren‐Muginstein, G.R.; Berger, S.; Rosen, A.

doi:10.1016/s0965-9773(99)00023-9

Cited by 95 publications

(42 citation statements)

References 17 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…The good agreement between the crystallite size distribution determined by line profile analysis and TEM is demonstrated in Fig. 14 for the sintered tungsten-carbide sample [27]. The bulk ultrafine-grained WC specimen was produced by ball-milling of submicron size powder and subsequent sintering at high temperature (1693 K).…”

Section: Ceramicsmentioning

confidence: 64%

“…Figure 13 shows the X-ray line profiles of the 1121 reflection corresponding to the ball-milled and compacted (open circles) and sintered (open squares) states of a tungsten-carbide specimen, respectively [27]. The long tail on the profile corresponding to the ball milled specimen indicates a wide size distribution, also proved by the more quantitative evaluation.…”

Section: Ceramicsmentioning

confidence: 80%

“…The crystallite size distribution of tungsten-carbide nanopowders obtained by ball-milling and the bulk specimen produced by sintering were studied by XLPA [27]. Figure 13 shows the X-ray line profiles of the 1121 reflection corresponding to the ball-milled and compacted (open circles) and sintered (open squares) states of a tungsten-carbide specimen, respectively [27].…”

Section: Ceramicsmentioning

confidence: 99%

“…The effect of stacking faults and twinning is worked out for cubic and hexagonal crystals [12][13][14][15][16][17][18][19][20][21]. Size broadening is treated in detail for spherical or non-spherical crystallites [22][23][24][25][26][27][28][29]. The effect of microstresses are worked out in detail for dislocations [28][29][30][31][32][33][34][35][36][37][38].…”

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Nanocrystalline materials studied by powder diffraction line profile analysis

Ungár¹,

Gubicza²

2007

Zeitschrift Für Kristallographie - Crystalline Materials

View full text Add to dashboard Cite

Abstract. X-ray powder diffraction is a powerful tool for characterising the microstructure of crystalline materials in terms of size and strain. It is widely applied for nanocrystalline materials, especially since other methods, in particular electron microscopy is, on the one hand tedious and time consuming, on the other hand, due to the often metastable states of nanomaterials it might change their microstructures. It is attempted to overview the applications of microstructure characterization by powder diffraction on nanocrystalline metals, alloys, ceramics and carbon base materials. Whenever opportunity is given, the data provided by the X-ray method are compared and discussed together with results of electron microscopy. Since the topic is vast we do not try to cover the entire field.

show abstract

Section: Ceramicsmentioning

confidence: 64%

Section: Ceramicsmentioning

confidence: 80%

Section: Ceramicsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Nanocrystalline materials studied by powder diffraction line profile analysis

Ungár¹,

Gubicza²

2007

Zeitschrift Für Kristallographie - Crystalline Materials

View full text Add to dashboard Cite

show abstract

“…The crystallite size distribution of nanopowders obtained by ball-milling and the bulk specimen produced by sintering were studied by X-ray line profile analysis [9]. The line breadths decreased down to about one-third during sintering as a consequence of the grain-growth at high temperature consolidation.…”

Section: Ceramicsmentioning

confidence: 99%

Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

Gubicza¹,

Ungár²

2016

Nano Online

View full text Add to dashboard Cite

Abstract. X-ray line profile analysis is a powerful alternative tool for determining dislocation densities, dislocation type, crystallite and subgrain size and size-distributions, and planar defects, especially the frequency of twin boundaries and stacking faults. The method is especially useful in the case of submicron grain size or nanocrystalline materials, where X-ray line broadening is a well pronounced effect, and the observation of defects with very large density is often not easy by transmission electron microscopy. The fundamentals of X-ray line broadening are summarized in terms of the different qualitative breadth methods, and the more sophisticated and more quantitative whole pattern fitting procedures. The efficiency and practical use of X-ray line profile analysis is shown by discussing its applications to metallic, ceramic, diamond-like and polymer nanomaterials.

show abstract