2024
DOI: 10.1016/j.materresbull.2023.112589
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Passivating defects in ZnO electron transport layer for enhancing performance of red InP-based quantum dot light-emitting diodes

Meijing Ning,
Ke Zhao,
Lijia Zhao
et al.
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Cited by 4 publications
(1 citation statement)
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“…The QLED with a 110-nm-thick ZnMgO NP ETL exhibited a peak EQE of 17.0%. Moreover, several groups have developed high-efficiency QLEDs by employing a core-shell structure with ZnMgO as the ETL to passivate defects in ZnO NPs, thereby increasing the Mg concentration in the shell layer [30][31][32]. Rather than focusing on direct contact between QDs and ZnO NPs, extensive study is currently underway regarding direct contact between QDs and ZnMgO NPs.…”
Section: Introductionmentioning
confidence: 99%
“…The QLED with a 110-nm-thick ZnMgO NP ETL exhibited a peak EQE of 17.0%. Moreover, several groups have developed high-efficiency QLEDs by employing a core-shell structure with ZnMgO as the ETL to passivate defects in ZnO NPs, thereby increasing the Mg concentration in the shell layer [30][31][32]. Rather than focusing on direct contact between QDs and ZnO NPs, extensive study is currently underway regarding direct contact between QDs and ZnMgO NPs.…”
Section: Introductionmentioning
confidence: 99%