2007
DOI: 10.1109/tcad.2007.892337
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Pattern-Based Iterative Method for Extreme Large Power/Ground Analysis

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Cited by 14 publications
(11 citation statements)
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“…Errors would occur due to the inaccuracy of I * Bi s. In Step 3 (called error reduction step), those errors are computed and fed back to the original grid to solve for the correction components. Instead of using the block Jacobi iteration process in [Shi et al 2007], the analysis schemes in Step 1 and Step 2 are employed to correct the circuit responses. It can be shown that by including…”
Section: K)mentioning
confidence: 99%
See 1 more Smart Citation
“…Errors would occur due to the inaccuracy of I * Bi s. In Step 3 (called error reduction step), those errors are computed and fed back to the original grid to solve for the correction components. Instead of using the block Jacobi iteration process in [Shi et al 2007], the analysis schemes in Step 1 and Step 2 are employed to correct the circuit responses. It can be shown that by including…”
Section: K)mentioning
confidence: 99%
“…After obtaining the full system solution, residues are computed and set as the new current loadings to the original grid to form a correction grid. Unlike the traditional block Jacobi iteration scheme [Shi et al 2007], which always sets boundary currents to zero in the error correction grid, the proposed process employs the boundary currents approximation scheme in Step 1 to provide a large coupling region to obtain more accurate boundary currents, thus reduce the errors more rapidly. Then the correction components of node voltages are computed in Step 2.…”
Section: Block Based Iterative Error Reductionmentioning
confidence: 99%
“…In our problem, we need to represent the log-normal random variable by using the Hermite PC expansion form (22) where . To find the other coefficients, we can apply (9) on .…”
Section: A Hermite Pc Representation Of Log-normal Variablesmentioning
confidence: 99%
“…On-chip power grid analysis and designs have been intensively studied in the past due to the increasing impacts of excessive voltage drops as technologies scale [2], [4], [11], [14], [21], [22], [25], [26], [29], [30], [32]. Owning to the increasing impacts of leakage currents and its variations on the circuit performances, especially on the on-chip power delivery networks, a number of research works have been proposed recently to perform the stochastic analysis of power grid networks under process-induced leakage current variations.…”
mentioning
confidence: 99%
“…Methods such as multigridlike [1,5], hierarchical [16,2], partition-based [3], fast iterative [13] and random walk based [12,4] approaches help improve scalability of power gird network analysis. Another * This work is supported in part by NSF CAREER Award under grant CCF-0448534, and UC Micro Program #06-252 and #07-105 via Cadence Design System Inc.…”
Section: Introductionmentioning
confidence: 99%