2021
DOI: 10.1109/tpel.2020.3005621
|View full text |Cite
|
Sign up to set email alerts
|

PCB-Embedded GaN-on-Si Half-Bridge and Driver ICs With On-Package Gate and DC-Link Capacitors

Abstract: A low-inductive half-bridge and gate driver package with on-package gate and dc-link capacitors is realized by printed circuit board (PCB) embedding of two GaN-on-Si ICs. While monolithic half-bridge and driver integration reduces on-chip parasitics, it does not solve the interconnection challenge to external capacitors. This letter solves this issue through advantageous combination of PCB embedding and monolithic circuit integration. This letter uses GaN-on-Si power circuits with integrated gate drivers, free… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
4
2

Relationship

1
5

Authors

Journals

citations
Cited by 23 publications
(1 citation statement)
references
References 17 publications
0
1
0
Order By: Relevance
“…GaN-based sense-FET ICs have been already demonstrated monolithically [ 31 , 32 , 33 , 34 , 35 , 36 , 37 ] and also by external wiring of several GaN devices [ 30 , 38 ] for single discrete transistors and used in half-bridges. This work focuses only on current-mirror sensing; other current sensing methods such as shunt-sensor [ 39 , 40 , 41 , 42 , 43 ] or hall-sensor [ 44 ] integration, as well as related magnetic flux concentrators [ 45 ] or magnetic sensors [ 46 ], were also demonstrated in GaN technologies. External current sensors or two-chip solutions (GaN and Si) are also often used and investigated for GaN power electronics [ 47 , 48 , 49 , 50 , 51 , 52 , 53 , 54 , 55 , 56 , 57 ].…”
Section: Introductionmentioning
confidence: 99%
“…GaN-based sense-FET ICs have been already demonstrated monolithically [ 31 , 32 , 33 , 34 , 35 , 36 , 37 ] and also by external wiring of several GaN devices [ 30 , 38 ] for single discrete transistors and used in half-bridges. This work focuses only on current-mirror sensing; other current sensing methods such as shunt-sensor [ 39 , 40 , 41 , 42 , 43 ] or hall-sensor [ 44 ] integration, as well as related magnetic flux concentrators [ 45 ] or magnetic sensors [ 46 ], were also demonstrated in GaN technologies. External current sensors or two-chip solutions (GaN and Si) are also often used and investigated for GaN power electronics [ 47 , 48 , 49 , 50 , 51 , 52 , 53 , 54 , 55 , 56 , 57 ].…”
Section: Introductionmentioning
confidence: 99%