PDA system for energy dispersive EXAFS

Allinson, Nigel M.; Baker, Gareth J.; Greaves, G.N.; Nicoll, J.

doi:10.1016/0168-9002(88)90450-0

Cited by 38 publications

(9 citation statements)

References 6 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Two types of photodiode array (PDA) detectors have been used with some success: (1) directly exposed X-ray PDAs − and (2) phosphor scintillators coupled to PDAs to convert X-ray photons to visible photons . The first type has a higher gain than the second one 71 but has a narrower detectable X-ray energy range (2−20 keV) and suffers radiation damage resulting in a permanent rise in dark count noise and a decrease in sensitivity.…”

Section: Linear Position-sensitive Detectorsmentioning

confidence: 99%

Small-Angle X-ray Scattering of Polymers

2001

View full text Add to dashboard Cite

Benjamin Chu obtained his B.S. degree, magna cum laude, from St. Norbert College and his Ph.D. degree in Physical Chemistry from Cornell University. He was a postdoctoral student with the late Professor Peter J. W. Debye for four years before he started his academic career at the University of Kansas. In 1968, he moved to the State University of New York at Stony Brook, where he is now a Distinguished Professor.

show abstract

Section: Linear Position-sensitive Detectorsmentioning

confidence: 99%

Small-Angle X-ray Scattering of Polymers

2001

View full text Add to dashboard Cite

show abstract

“…Starting from the pioneering work of Matsushita et al (Matsushita & Kaminaga, 1980), the parallel energy acquisition mode (dispersive mode, or D-XAS) has been further developed at the different synchrotron radiation facilities (Phizackerley et al, 1983;Flank et al, 1983;Allinson et al, 1988;Hagelstein et al, 1989;D'Acapito et al, 1992;Allen et al, 1992;Lee et al, 1994) and extensively exploited in different scienti®c domains, from chemistry to biology to solid-state physics (for a review see Fontaine et al, 1989, and references therein).…”

Section: Introductionmentioning

confidence: 99%

Turbo-XAS: dispersive XAS using sequential acquisition

Pascarelli

Neisius

Panfilis

1999

J Synchrotron Radiat

View full text Add to dashboard Cite

A new experimental technique for time-resolved X-ray absorption studies in the sub-second range has been successfully tested on the dispersive XAS beamline (ID24) at the ESRF. It consists of a sequential acquisition of energy points using the dispersive optics scheme installed on the beamline. Turbo-XAS takes full advantage of the properties of third-generation radiation sources, overcoming many of the problems encountered in the classical dispersive XAS mode, based on position-sensitive detectors. The new technique bene®ts from the basic assets of the dispersive set-up, i.e. the absence of movement of the optics and the extremely small and stable horizontal focal spot. In addition, it features simultaneous recording of I 0 and I 1 and the possibility of performing¯uorescence and electron detection.

show abstract

“…This is particularly important for, for example, high-pressure studies in a diamond-anvil cell in which the X-rays must pass through an aperture only a few hundred ~m in diameter and for studies of photoexcited states where high excitation power density is necessary. The most commonly employed technique for achieving a desired bend on a crystal has been to apply a force to the apex of a triangular crystal which is held fixed at its base (Phizackerley, Rek, Stephenson, Conradson, Hodgson, Matsushita & Oyanagi, 1983;Dartyge, Depautex, Dubuisson, Fontaine, Jucha, Leboucher & Tourillon, 1986;Allinson, Baker, Greaves & Nicoll, 1988;Hagelstein, Cunis, Frahm, Niemann & Rabe, 1989;Batterman & Berman, 1983). The resulting cylindrical bend, however, produces a broadening of the polychromatic focus spot, which is proportional to the square of the illuminated length of the crystal (Ice & Sparks, 1984).…”

Section: Introductionmentioning

confidence: 99%

A four-point crystal bender for dispersive X-ray absorption spectroscopy

Allen¹,

Conradson²,

Penner‐Hahn³

1993

J Appl Cryst

View full text Add to dashboard Cite

A new crystal bender for dispersive X-ray absorption fine-structure spectroscopy (XAFS) has been built and its performance characterized. The bender employs an adjustable four-point bending mechanism and a contoured crystal, which makes it possible to produce an excellent approximation of the ideal elliptical bend from 8000 to 20000 eV with a single such Si (220) crystal. With the near-elliptical optics, it is possible to achieve a focus size of 175 lam with a 5 mm source and simultaneously to achieve a useful bandpass of 700 at 9000, 1200 at 11 500 and 2000 eV at 18 000 eV. The upper limit on the resolution, which is dictated by the finite source size in this configuration, is 2-5 eV for all of the energy ranges studied.

show abstract

PDA system for energy dispersive EXAFS

Cited by 38 publications

References 6 publications

Small-Angle X-ray Scattering of Polymers

Small-Angle X-ray Scattering of Polymers

Turbo-XAS: dispersive XAS using sequential acquisition

A four-point crystal bender for dispersive X-ray absorption spectroscopy

Contact Info

Product

Resources

About