SUMMARYThe reliability of microfocus x-radiography for detecting internal voids in structural ceramic test specimens was statistically evaluated. The microfocus system was operated tn the projection mode using low x-ray p'hoton energies (~20 keV) and a 10 lim focal spot. The statistics were developedJor implanted internal voids in green and sintered silicon carbide and silicon nitride test specimens. These statistics were compared with previouslyobtained statistics for implanted surface voids in similar specimens. Problems associated with void implantation and characterization are discussed. Statistical results are given as probability-of-detection curves at a 95 percent confidence level for voids ranging in size from 20 to 528 lim in diameter ..