PERCIVAL: possible applications in X-ray micro-tomography

Pinaroli, G.; Lautizi, Ginevra; Donato, Sandro; Stebel, L.; Cautero, G.; Giuressi, D.; Gregori, I.; Zilio, Simone Dal; Sergo, R.; Scarcia, Martin; Cudin, Ivan; Wunderer, C.; Correa, Jonathan; Marras, A.; Aplin, S.; Boitrelle, B.; Orsini, F.; Goettlicher, P.; Kuhn, Manuela; Lange, S.; Niemann, M.; Shevyakov, I.; Zimmer, M.; Guerrini, N.; Marsh, B.; Sedgwick, I.; Greer, A.L.; Nicholls, T.; Pedersen, U.; Tartoni, N.; Hyun, H.J.; Kim, K.; Rah, S.; Graafsma, H.; Menk, R. H.

doi:10.1088/1748-0221/15/02/c02007

Cited by 2 publications

(1 citation statement)

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“…These resolution characteristics are superior to those of the indirect conversion-type device of the X-ray sCMOS camera [4,23] below 20 keV. These are also superior to those of recent direct conversion-type devices [24].…”

Section: Spacial Resolution Characteristicsmentioning

confidence: 92%

“INTPIX4NA” — new integration-type silicon-on-insulator pixel detector for imaging application

et al. 2021

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A: INTPIX4NA is an integration-type silicon-on-insulator pixel detector. This detector has a 14.1 × 8.7 mm 2 sensitive area, 425,984 (832 column × 512 row matrix) pixels and the pixel size is 17 × 17 μm 2 . This detector was developed for residual stress measurement using X-rays (the 𝑐𝑜𝑠𝛼 method). The performance of INTPIX4NA was tested with the synchrotron beamlines of the Photon Factory (KEK), and the following results were obtained. The modulation transfer function, the index of the spatial resolution, was more than 50% at the Nyquist frequency (29.4 cycle/mm). The energy resolution analyzed from the collected charge counts is 35.3%-46.2% at 5.415 keV, 21.7%-35.6% at 8 keV, and 15.7%-19.4% at 12 keV. The X-ray signal can be separated from the noise even at a low energy of 5.415 keV at room temperature (approximately 25-27 • C). The maximum frame rate at which the signal quality can be maintained is 153 fps in the current measurement system. These results satisfy the required performance in the air and at room temperature (approximately 25-27 • C) condition that is assumed for the environment of the residual stress measurement.

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Section: Spacial Resolution Characteristicsmentioning

confidence: 92%

“INTPIX4NA” — new integration-type silicon-on-insulator pixel detector for imaging application

et al. 2021

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INTPIX4NA -- new integration-type silicon-on-insulator pixel detector for imaging application

Nishimura,

Kishimoto,

Sasaki

et al. 2021

Preprint

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A: INTPIX4NA is an integration-type silicon-on-insulator pixel detector. This detector has a 14.1 × 8.7 mm 2 sensitive area, 425,984 (832 column × 512 row matrix) pixels and the pixel size is 17 × 17 µm 2 . This detector was developed for residual stress measurement using X-rays (the 𝑐𝑜𝑠𝛼 method). The performance of INTPIX4NA was tested with the synchrotron beamlines of the Photon Factory (KEK), and the following results were obtained. The modulation transfer function, the index of the spatial resolution, was more than 50% at the Nyquist frequency (29.4 cycle/mm). The energy resolution analyzed from the collected charge counts is 35.3%-46.2% at 5.415 keV, 21.7%-35.6% at 8 keV, and 15.7%-19.4% at 12 keV. The X-ray signal can be separated from the noise even at a low energy of 5.415 keV at room temperature (approximately 25-27 °C). The maximum frame rate at which the signal quality can be maintained is 153 fps in the current measurement system. These results satisfy the required performance in the air and at room temperature (approximately 25-27 °C) condition that is assumed for the environment of the residual stress measurement.

show abstract

PERCIVAL: possible applications in X-ray micro-tomography

Cited by 2 publications

References 10 publications

“INTPIX4NA” — new integration-type silicon-on-insulator pixel detector for imaging application

“INTPIX4NA” — new integration-type silicon-on-insulator pixel detector for imaging application

INTPIX4NA -- new integration-type silicon-on-insulator pixel detector for imaging application

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