2000
DOI: 10.1088/0305-4470/33/8/312
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Percolation and conduction in restricted geometries

Abstract: The finite-size scaling behaviour for percolation and conduction is studied in two-dimensional triangular-shaped random resistor networks at the percolation threshold. The numerical simulations are performed using an efficient star-triangle algorithm. The percolation exponents, linked to the critical behaviour at corners, are in good agreement with the conformal results. The conductivity exponent, t ′ = ζ/ν, is found to be independent of the shape of the system. Its value is very close to recent estimates for … Show more

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Cited by 10 publications
(9 citation statements)
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“…Interestingly, the universal percolation exponents t and s for the 820 nm and 210 nm tubes have similar values. These values are close to those theoretically expected for a large conducting 2D network, where s = t ≈ 1.3. Kholodenko and Freed argue for the exact 2D exponent value, 23/18 ≈ 1.28.…”
Section: Resultssupporting
confidence: 88%
See 1 more Smart Citation
“…Interestingly, the universal percolation exponents t and s for the 820 nm and 210 nm tubes have similar values. These values are close to those theoretically expected for a large conducting 2D network, where s = t ≈ 1.3. Kholodenko and Freed argue for the exact 2D exponent value, 23/18 ≈ 1.28.…”
Section: Resultssupporting
confidence: 88%
“…Rather, they are found to be in accord with those predicted by GEM theory in 3D, s ≈ 0.8 and t ≈ 2.0. This indicates that an increasing fraction of SWCNT connections are being made in the third dimension in these short tube networks. ,, …”
Section: Resultsmentioning
confidence: 91%
“…The metallic data (Figure b) yield σ 0 = 3.3 × 10 –4 □ Ω –1 and h c = 12 ± 2 nm with a critical exponent of 0.92 ± 0.1, while the fit of the semiconducting data (Figure e) yields σ 0 = 7.7 x10 –5 □ Ω –1 and h c = 6 ± 2 nm with a critical exponent of 1.15 ± 0.1. Results from both film types are in agreement with accepted values of the critical exponent (α ≈ 1) for percolated 2D conducting networks. Film thicknesses range from 9 to 72 nm, much less than the wavelength of light, and the transmittance as a function of sheet resistance, R s , is fit to the expression , T ( R S ) = true( 1 + 1 2 R normalS normalμ 0 normalε 0 normalσ normalo normalp normalσ normald normalc true) 2 where ε 0 and μ 0 are the permittivity and permeability of free space, respectively, σ op is the optical conductivity, and σ dc is the direct current conductivity. The ratio σ op /σ dc quantifies the combined optical and electronic quality of the films.…”
Section: Resultssupporting
confidence: 78%
“…In the case of disordered systems, their physical behavior can usually be described by a power law with a percolation threshold and a critical exponent depending on the geometry [299,300,209,301] and on the conduction of the system [287,288,291,290,302]. One should also not exclude the local field changes in the composite due to interaction of inclusions.…”
Section: Percolation Theorymentioning
confidence: 99%