We study the current flow paths between two edges in a random resistor network on a L×L square lattice. Each resistor has resistance e ax , where x is a uniformly-distributed random variable and a controls the broadness of the distribution. We find (a) the scaled variable u ≡ L/a ν , where ν is the percolation connectedness exponent, fully determines the distribution of the current path length ℓ for all values of u. For u ≫ 1, the behavior corresponds to the weak disorder limit and ℓ scales as ℓ ∼ L, while for u ≪ 1, the behavior corresponds to the strong disorder limit with ℓ ∼ L d opt , where d opt = 1.22 ± 0.01 is the optimal path exponent. (b) In the weak disorder regime, there is a length scale ξ ∼ a ν , below which strong disorder and critical percolation characterize the current path.