2016
DOI: 10.1088/1674-4926/37/5/054003
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Performance analysis of charge plasma based dual electrode tunnel FET

Abstract: This paper proposes the charge plasma based dual electrode doping-less tunnel FET (DEDLTFET). The paper compares the device performance of the conventional doping-less TFET (DLTFET) and doped TFET (DGTFET). DEDLTEFT gives the superior results with high ON state current (ION ∼ 0.56 mA/μm), ION/IOFF ratio ∼ 9.12 × 1013 and an average subthreshold swing (AV-SS ∼ 48 mV/dec). The variation of different device parameters such as channel length, gate oxide material, gate oxide thickness, silicon thickness, gate work … Show more

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Cited by 40 publications
(21 citation statements)
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“…Lateral tunnelling in the nanotube device leads to better performance because of the dependency of band‐to‐band tunnelling, the mechanism through which the current flows in TFETs, on the junction cross‐sectional area [15]. The core consists of silicon dioxide (SiO 2 ) with a platinum electrode whose work function is equal to 5.93 eV and a hafnium electrode whose work function is 3.9 eV to form the source and drain, respectively, because the device is dopingless [16]. Application of the charge plasma technique allows the elimination of the doping techniques implemented at high temperatures [17].…”
Section: Device Structuresmentioning
confidence: 99%
“…Lateral tunnelling in the nanotube device leads to better performance because of the dependency of band‐to‐band tunnelling, the mechanism through which the current flows in TFETs, on the junction cross‐sectional area [15]. The core consists of silicon dioxide (SiO 2 ) with a platinum electrode whose work function is equal to 5.93 eV and a hafnium electrode whose work function is 3.9 eV to form the source and drain, respectively, because the device is dopingless [16]. Application of the charge plasma technique allows the elimination of the doping techniques implemented at high temperatures [17].…”
Section: Device Structuresmentioning
confidence: 99%
“…B. V. Chandan et al proposed Junction less based dielectric modulated electrically doped TFET (JL-DM-ED-TFET) biosensor for label-free detection of biomolecules [12]. The utilization of a control gate and polarity gate with suitable work function [43] over the intrinsic silicon avoids the need for physical doping and form the p-i-n structure. The cavity is created under the control gate for the immobilization of biomolecules to enable dielectric modulation.…”
Section: Junction Less and Doping Less Tfet Based Biosensorsmentioning
confidence: 99%
“…In addition, the total current density of the H-DLTFET, according to the on-state, was researched in order to understand the operating mechanism, as shown in Figure 4d. The electrons from the source region and the channel bottom region could be easily absorbed by the drain region to form the tunneling leakage current [28,29]. As an important parameter, the transconductance (g m ) was used to evaluate the simulation performance of the device, which was defined as the first derivative of the transfer characteristic [27], and the value of g m is provided by Equation 1:…”
Section: The Operating Mechanism Of H-dltfetsmentioning
confidence: 99%
“…In addition, the total current density of the H-DLTFET, according to the on-state, was researched in order to understand the operating mechanism, as shown in Figure 4d. The electrons from the source region and the channel bottom region could be easily absorbed by the drain region to form the tunneling leakage current [28,29]. Figure 5 shows the on-state energy band of the DLTFET and the H-DLTFET when they were in different locations.…”
Section: The Operating Mechanism Of H-dltfetsmentioning
confidence: 99%