2018
DOI: 10.1109/tns.2018.2838766
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Performance Comparison of X- and <inline-formula> <tex-math notation="LaTeX">$\gamma$ </tex-math> </inline-formula>-Ray CdTe Detectors With MoO<italic>x</italic>, TiO<italic>x</italic>, and TiN Schottky Contacts

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Cited by 12 publications
(13 citation statements)
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“…However, the signal from 137 Cs isotope (662 keV) is measured with a very promising resolution of 6.1% at the same reverse bias (see Fig. 5b) that is slightly better in comparison to a conventional In/CdTe/Pt detector, measured at the same temperature of 300 K 23 .
Figure 5Spectra of 241 Am (59 keV) ( a ) and 137 Cs (662 keV) ( b ) X-ray sources taken with the graphene/CdTe/Au detector at 300 K.
…”
Section: Resultsmentioning
confidence: 89%
“…However, the signal from 137 Cs isotope (662 keV) is measured with a very promising resolution of 6.1% at the same reverse bias (see Fig. 5b) that is slightly better in comparison to a conventional In/CdTe/Pt detector, measured at the same temperature of 300 K 23 .
Figure 5Spectra of 241 Am (59 keV) ( a ) and 137 Cs (662 keV) ( b ) X-ray sources taken with the graphene/CdTe/Au detector at 300 K.
…”
Section: Resultsmentioning
confidence: 89%
“…Moreover, MoO x is favorably distinguished by its high transparency for visible radiation and relatively low specific electrical resistivity. Due to these properties and high work function (5.2-6 eV) [37], MoO x has been considered and studied as a promising candidate to form efficient electrical contacts to semi-insulating p-CdTe semiconductor crystals [21][22][23][24][25].…”
Section: Semiconductor Samplesmentioning
confidence: 99%
“…An additional confirmation of this assumption is provided by the comparison of the experimental I-V characteristics with the calculation results obtained in the framework of the Sah-Noyce-Shockley theory of generation-recombination of carriers, adapted to a metal-semiconductor (Schottky) contact (Figure 5). According to the theory [41], the generation current I g can be found by integration of the generation rate U(x) throughout the entire SCR as shown in [17,[21][22][23][24][25][42][43][44][45][46]:…”
Section: Electrical Characteristics Ofmentioning
confidence: 99%
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