2006
DOI: 10.1063/1.2161823
|View full text |Cite
|
Sign up to set email alerts
|

Performance evaluation of picosecond high-voltage power switches based on propagation of superfast impact ionization fronts in SiC structures

Abstract: We employ a simple analytical model of superfast impact ionization front in a reversely biased p+-n-n+ structure to evaluate the performance of prospective 4H-SiC closing switches based on propagation of ionization fronts. The model allows to relate the order of magnitude values of the front velocity and the electron-hole plasma concentration behind the front to the basic material and structural parameters. We show that high avalanche breakdown field and impact ionization rate of the wide-band-gap 4H-SiC lead … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
10
0

Year Published

2007
2007
2023
2023

Publication Types

Select...
6
2

Relationship

1
7

Authors

Journals

citations
Cited by 12 publications
(10 citation statements)
references
References 25 publications
0
10
0
Order By: Relevance
“…We feel this paper is a valuable contribution toward designing new fast-closing switches that may include advanced semiconductor materials, such as SiC [16]. It may also impact the design of the driving circuit as in [21], which may include a fast opening-switch component [24].…”
Section: Discussionmentioning
confidence: 98%
See 1 more Smart Citation
“…We feel this paper is a valuable contribution toward designing new fast-closing switches that may include advanced semiconductor materials, such as SiC [16]. It may also impact the design of the driving circuit as in [21], which may include a fast opening-switch component [24].…”
Section: Discussionmentioning
confidence: 98%
“…Their calculation showed that a reverse sharp voltage ramp of ∼10 kV/ns will result in a voltage drop of ∼8 kV within 15 ps, thus a voltage rise rate of ∼500 kV/ns can be applied to the load. A similar mechanism in a SiC p + -n-n + structure is calculated in [16]. Rodin et al [15] calculated that a voltage ramp of >1 kV/ns applied on a 100 μm Si bulk (without p-n junctions) can result in some 1-kV, 100-ps pulses [17].…”
mentioning
confidence: 97%
“…semiconductor material for high-voltage pulse power application [12], [13], have not been successful until now. The studies we report in this paper are part of the ongoing research project aimed at finding the physical fundamentals of delayed avalanche breakdown.…”
Section: Introductionmentioning
confidence: 99%
“…No reasonable semiconductor offers both improved breakdown field and high mobility and lifetime except for diamond and SiC to potentially outperform Si. The team at Ioffe is actively exploring the potential of the SiC technology [12][13][14] . Presented here is an early attempt to assess the potential of diamond.…”
Section: Introductionmentioning
confidence: 99%