Active matrix flat-panel imagers (AMFPIs) offer many advantages and have
become ubiquitous across a wide variety of medical x-ray imaging applications.
However, for mammography, the imaging performance of conventional AMFPIs
incorporating CsI:Tl scintillators or a-Se photoconductors is limited by their
relatively modest signal-to-noise ratio (SNR), particularly at low x-ray
exposures or high spatial resolution. One strategy for overcoming this
limitation involves the use of a high gain photoconductor such as mercuric
iodide (HgI2) which has the potential to improve the signal-to-noise
ratio by virtue of its low effective work function (WEFF). In this
study, the performance of direct-detection AMFPI prototypes employing relatively
thin layers of polycrystalline HgI2 operated under mammographic
irradiation conditions over a range of 0.5 to 16.0 mR is presented. High x-ray
sensitivity (corresponding to WEFF values of ~19 eV), low dark
current (<0.1 pA/mm2) and good spatial resolution, largely
limited by the size of the pixel pitch, were observed. For one prototype, a
detective quantum efficiency of ~70% was observed at an x-ray exposure of
~0.5 mR at 26 kVp.