“…Previous studies have shown that the V OC is affected by the native defects in polycrystalline perovskite films due to the overflowing of the organic components during the annealing process. [13][14][15] These defects induce nonradiative recombination, 13,[16][17][18][19] which leads to a shortened carrier lifetime and decreased V OC . 20,21 Therefore, reducing the trap states, especially the deep trap states, can decrease the charge recombination loss.…”