“…Typically, background noise and gamma rays produce spurious counts that affect neutron counts [46], and the background noise was mainly introduced by the reverse leakage of the SiC diode and the backend readout electronics system. However, extensive experimental tests have shown that the energy deposited by gamma rays in the SiC detector region is less than 300 keV [30], [31], [32], [48], [49], while spurious counts introduced by background noise exist only in the energy range below 300 keV [31], [32], [46], [50], [51]. Hence, in this work, spurious counts can be completely prevented by setting the low-level discriminator (LLD) to 300 keV using the G4stepping class [39], [40].…”