Performance of Electric Near-Field Probes for Immunity Tests

Wu, Xinglong; Grassi, Flavia; Pignari, Sergio A.; Paoletti, Umberto; Hoda, Isao

doi:10.23919/ursigass49373.2020.9232438

Cited by 3 publications

(4 citation statements)

References 6 publications

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“…The obtained transfer functions were combined with the transfer function from the probe input to the trace output, which was predicted by exploiting the proposed circuit-based model (whose parameters were suitably adapted to the PCB under test by the correction factor introduced in Sec. IV), to obtain the overall transfer function Hs(f) in (10). Then Vin(f) is computed and transformed to the input waveform, vin, to be generated by AWG and injected by the near-field probe during the test.…”

Section: B Measurement Resultsmentioning

confidence: 99%

“…Eventually, the input waveform vin(t) is obtained by Inverse FFT (IFFT). In (10), the transfer function Hs(f) accounts for all the effects introduced by the measurement chain, including not only the transfer function introduced by the near-field probe as well as propagation effects along the trace under test, but also those effects due to cables, adapters/attenuators, and RF amplifiers used to connect the AWG output to the probe input in the actual setup. Towards this goal, the availability of accurate models of the injection probe plays a fundamental role.…”

Section: B Equalization Proceduresmentioning

confidence: 99%

“…The feasibility of using both electric and magnetic near-field probes for immunity verification at PCB level was investigated in [7] and [8], [9], respectively. A comparison of performance of different electric near-field (E-field) probes for immunity investigations is provided in [10].…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Test Design Methodology for Time-Domain Immunity Investigations Using Electric Near-Field Probes

Grassi

Spadacini

et al. 2022

IEEE Trans. Electromagn. Compat.

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This work investigates the possibility to develop timedomain immunity tests using electric near-field probes, for flexible customization of broadband input waveforms injected into specific pins of PCBs. For this purpose, a test design methodology is proposed, which is based on circuit modelling of the injection mechanism on the one hand, and on pulse design and equalization on the other hand. Two circuit models are developed. The former employs measurement/simulation data along with port-reduction techniques to model noise injection through near-field probes by means of internal induced sources. Conversely, the latter model only includes passive components, and is derived starting from physical observation of the involved phenomena. Both models are compatible with circuit solvers and can be easily adapted for different traces under test. Since pulse-like noise is usually broadband, suitable stress waveforms are utilized to obtain different noise spectra. Also, in order to precisely control the shape of the waveform reaching the targeted pin, an equalization procedure is employed. These models and techniques can be easily applied to amplification systems originally designed for frequencydomain tests, thus providing a comprehensive solution for the design of broadband immunity tests in the time domain. The feasibility and accuracy of the proposed methodology are proved by full-wave simulations and measurements.

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Section: B Measurement Resultsmentioning

confidence: 99%

Section: B Equalization Proceduresmentioning

confidence: 99%

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Test Design Methodology for Time-Domain Immunity Investigations Using Electric Near-Field Probes

Grassi

Spadacini

et al. 2022

IEEE Trans. Electromagn. Compat.

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“…Conversely, propagation effects along VNA cables are excluded through calibration (calibration kit Agilent N4431B). Details on the impact of the PCB traces (including probe-to-trace coupling) can be found in [15] and [10], respectively. The influence of different types of probes on coupling effectiveness will be addressed in the following subsections.…”

Section: Coupling Performancementioning

confidence: 99%

Analysis of Near-Field Probing Techniques for Immunity Tests

Grassi

Spadacini

et al. 2022

2022 ESA Workshop on Aerospace EMC (Aerospace EMC)

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This work experimentally investigates the performance of near-field probes as injection devices for wideband immunity tests. To this end, the coupling effectiveness and resolution of different kinds of magnetic and electric near-field probes are firstly investigated in terms of Sparameters measured with the probes placed on microstrip traces. Different test benches are set up and experimentally characterized in order to investigate the characteristics and determine the frequency response of the transfer function of a typical measurement chain for immunity verification. Finally, time-domain near-field tests employing arbitrary waveform generators are introduced, showing the feasibility of injecting customized wideband noise waveforms at specific pins.

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