The Gas Electron Multiplier (GEM) is a new age detector,
which can handle the high flux of particles. The GEM foil, which is
constructed using 50 μm highly insulating foil
(Kapton/Apical) coated with 5 μm layers of copper, on both
sides, with a network of specifically shaped holes is the major
component of these detectors. The European Center for Nuclear
Research (CERN) has been the sole supplier of the GEM foils until
recently when a few other companies started manufacturing GEM foils
under the transfer of technology (TOT) agrement from CERN. Techtra
is one such company in Europe which gained a right to use CERN
developed technology in order to produce commercially viable GEM
foils. Micropack Pvt. Ltd. is another company in India which has
successfully manufactured good quality GEM foils. Due to the
microscopic structure of holes and dependence on the electric field
inside, it becomes essential to study the defect and uniformity of
holes along with the electrical property of foils under ambient
conditions. In this work we are reporting the tests condition of
Techtra GEM foils. We report on the development of a cost effective
and efficient technique to study the GEM foils holes geometry,
distribution, and defects. We also report on the electrical
properties of these foils like leakage current, stability, and
discharges. At the detector level, we describe the high voltage (HV)
response, gain, uniformity, and stability. The GEMs have been
proposed to have a wider applications, so we performed a feasibility
study to utilize these for the imaging. We irrediated various
objects of varying density with X-rays and reconstructed the
images. The reconstructed image shows a good distinction between
materials of different densities, which can be very useful in
various applications like medical imaging or cargo imaging.