Performance of three different Si X-ray detectors for portable XRF spectrometers in cultural heritage applications

Abstract

In this work, a study of detection systems in portable X-ray fluorescence (PXRF) spectrometry was performed. An assessment of various detectors and their influence on the measurement of trace elements in different bulk materials, from light to heavy matrices, was done. Four reference materials were analyzed: Orchard Leaves (NBS-1571); Bone Meal (NIST-1486); River Sediment (NBS-1645) and Free-Cutting Brass (NBS-1105). Detection limits were calculated for the elements present in the reference materials, quantitative calculations were performed for three known samples and a comparison was made for each detector. Three case studies were also performed in order to appraise the behavior of the detection systems: A paper document from 1909, a potassium alum/calcite mixture and a Portuguese coin.

Comparison of gold leaf thickness in Namban folding screens using X-ray fluorescence

“…The energy resolution is 190 eV at 5.9 keV, and the acquisition system is Amptek PMCA [21]. For collimating the beam, an acrylic support with a 2 mm pinhole in Ta was used and a spot size of 0.5 cm on the sample is obtained.…”

Theoretical and experimental study on the angular dependence of scattering processes in X‐ray fluorescence systems

“…The radiation is collimated by a tantalum collimator allowing a 5‐mm diameter beam on the sample, placed at 46.5‐mm distance from the tube. The detector is an Amptek XR‐100SDD with a 25‐mm 2 detection area collimated down to 17.12 mm 2 and 500 μ m thick fully depleted, and with a 12.5 μ m Be window . An extra collimator was attached to the detector to better define the geometry, resulting in a 3° uncertainty and defining a 6‐msr solid angle.…”

A‐site Cation Engineering for Highly Efficient MAPbI3 Single‐Crystal X‐ray Detector

“…[5] High detector sensitivity and low detect limitation are considered as the most critical metrics for X-ray detectors,w hich are highly desired in the actual application to reduce the total X-ray dose exposure. Only few semiconductors are able to combine some of the abovementioned features to exhibit intriguing performance.C urrent state-of-the-art semiconductors used for X-ray detectors including amorphous Se (a-Se), [8] Si [9] and CdZnTe. Only few semiconductors are able to combine some of the abovementioned features to exhibit intriguing performance.C urrent state-of-the-art semiconductors used for X-ray detectors including amorphous Se (a-Se), [8] Si [9] and CdZnTe.…”

“…[6] Efficient semiconductor X-ray detector required the materials with the following characteristics:l arge attenuation coefficient (a)t oe ffectively interact with the X-ray photons and generate free charges ( Figure 1a); large carrier mobility (m)a nd lifetime (t)p roduct (mt product) to ensure high charge collection efficiency; [7] high resistivity and negligible leakage current to achieve low detect limitation. Only few semiconductors are able to combine some of the abovementioned features to exhibit intriguing performance.C urrent state-of-the-art semiconductors used for X-ray detectors including amorphous Se (a-Se), [8] Si [9] and CdZnTe. [10] However,e ach of them suffers from inherent shortcomings or persistent unsettled problems in crystal growth.…”