Mg doped ZnO thin films were prepared by magnetron sputtering and were irradiated by linearly polarized femtosecond laser pulse. Scanning electron microscopy (SEM) characterizations illustrated that regularly arranged nanoripples appeared on the ablation area with the period perpendicular to the polarization direction in the range of 250 nm~570 nm, but parallel to the polarization direction in the range of 2.2 μm~2.5 μm. The redshift of Raman peaks was observed at the central ablation area of the nanoripples, while, both blueshift and redshift were found at the edge area, which could be ascribed to the defects as well as the nanoripple structure.