A method is described for the preparation of wire samples for transmission electron microscopy. The specimen preparation involves three consecutive steps, i.e. pregrinding. electrolytic niicrojet machining and final bath polishing. By this method electron transparent areas of wires less than 1 mm in diameter can be prepared in less than one hour. Further advantages of this method are that the area of examination can be !ocated kery accurately, specimen deformation due to handling is avoided, and very brittle materials can be prepared conveniently.