Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process

Vališ, David; Forbelská, Marie; Vintr, Zdeněk; Leuchter, Jan; La, Quoc Tiep

doi:10.1016/j.measurement.2022.112222

Measurement

2023

DOI: 10.1016/j.measurement.2022.112222

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Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process

David Vališ

Marie Forbelská

Zdeněk Vintr

et al.

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2024

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Cited by 2 publications

References 26 publications

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A Weibull–lognormal-based life prediction model for LED light with four groups of ADTs

Zhang,

Mu,

et al. 2024

Lighting Research & Technology

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Four groups of accelerated degradation tests of light-emitting diode (LED) lights under constant current stresses were carried out with the goal of precisely and rapidly obtaining the conventional life of LED lights. Three-parameter Weibull function and right approximation method were used to fit the test data of the luminance degradation with time of samples under different stresses, and the pseudo-failure time of each sample was calculated according to the failure criteria. Then combined with lognormal distribution and least square method, the life distribution of LED lights under each stress was determined, and the life of LED lights under conventional stress was extrapolated by inverse power law. The results show that the obtained luminance degradation data can reflect the decay trend of LED lights preferably and obey the three-parameter Weibull function, the lognormal distribution has a good fitting effect on the failure time distribution of LED lights, and the conventional life predicted by the model combined with Weibull function and lognormal distribution has a high accuracy. Manufacturers and researchers of LED lights can benefit from theoretical foundation and technical reference offered by the life tests of LED lights and the established life prediction model.

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A Weibull–lognormal-based life prediction model for LED light with four groups of ADTs

Zhang,

Mu,

et al. 2024

Lighting Research & Technology

View full text Add to dashboard Cite

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Multiple stresses optimization design of constant-stress accelerated degradation test based on Wiener process

Nianhuan,

Dongwei,

Zhiqiong

et al. 2024

Proceedings of the Institution of Mechanical Engineers, Part O:

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Constant-stress accelerated degradation test (CSADT) is an effective means of evaluating the reliability of products, to ensure accurate assessment of reliability-related indicators under limited funds. The optimized design of CSADT has been widely applied. The advantage of Wiener process in capturing the random nature of non-monotonic degradation paths caused by inherent uncertainties in products has also been widely used in the application of accelerated degradation tests (ADT). To address the drawback of traditional Wiener process with constant diffusion coefficients leading to low accuracy in test evaluation, a multi-stress coupled constant acceleration degradation model with stress-related diffusion coefficients is proposed. This includes the construction of a D-optimization criterion that minimizes the variance of model parameter estimation as the optimization target, and a scheme optimization method based on Particle Swarm Optimization (PSO) with cost constraints. Through the analysis of a case study of ADT for LED lamps, comparison and parameter sensitivity analysis of four accelerated degradation models with or without considering stress-related diffusion coefficients, the effectiveness, and robustness of the model in the paper are validated.

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Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process

Cited by 2 publications

References 26 publications

A Weibull–lognormal-based life prediction model for LED light with four groups of ADTs

A Weibull–lognormal-based life prediction model for LED light with four groups of ADTs

Multiple stresses optimization design of constant-stress accelerated degradation test based on Wiener process

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