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Hyperspectral LiDAR enables non-contact mapping of the 3D surface geometry of an object along with its spectral reflectance signature and has proved to be effective for automated point cloud segmentation in various remote sensing applications. The established hyperspectral LiDAR methods offer a range precision of a few mm to a few cm for distances exceeding several meters. We propose a novel approach to hyperspectral LiDAR scanning based on a supercontinuum (SC) coherently broadened from a 780 nm frequency comb. It provides high precision distance measurements along with target reflectance over the 570–970 nm range of the SC output. The distance measurements are carried out by monitoring the differential phase delay of intermode beat notes generated by direct photodetection, while the backscattered light spectrum is acquired using a commercial CCD spectrometer with 0.16 nm resolution across the 400 nm bandwidth of the SC output. We demonstrate a measurement precision below 0.1 mm for a stand-off range up to 50 m on a diffuse target with around 89% reflectance. The measured relative accuracy as compared to a reference interferometer is on the order of 10−5 for distances up to 50 m. Initial results also indicate spectrum-based material classification within a 3D point cloud using a linear support vector machine. The results highlight the potential of this approach for joint high-precision laser scanning and automated material classification.
Hyperspectral LiDAR enables non-contact mapping of the 3D surface geometry of an object along with its spectral reflectance signature and has proved to be effective for automated point cloud segmentation in various remote sensing applications. The established hyperspectral LiDAR methods offer a range precision of a few mm to a few cm for distances exceeding several meters. We propose a novel approach to hyperspectral LiDAR scanning based on a supercontinuum (SC) coherently broadened from a 780 nm frequency comb. It provides high precision distance measurements along with target reflectance over the 570–970 nm range of the SC output. The distance measurements are carried out by monitoring the differential phase delay of intermode beat notes generated by direct photodetection, while the backscattered light spectrum is acquired using a commercial CCD spectrometer with 0.16 nm resolution across the 400 nm bandwidth of the SC output. We demonstrate a measurement precision below 0.1 mm for a stand-off range up to 50 m on a diffuse target with around 89% reflectance. The measured relative accuracy as compared to a reference interferometer is on the order of 10−5 for distances up to 50 m. Initial results also indicate spectrum-based material classification within a 3D point cloud using a linear support vector machine. The results highlight the potential of this approach for joint high-precision laser scanning and automated material classification.
Simultaneous distance measurements on two or more optical wavelengths enable dispersion-based correction of deviations that result from insufficient knowledge of the refractive index along the signal propagation path. We demonstrate a supercontinuum-based approach for highly accurate distance measurements suitable for such an inline refractivity compensation. The distance is estimated from the phase delay observations on the intermode beats. We use a supercontinuum (SC) coherently broadened from a 780 nm frequency comb and spanning the spectral range of 570-970 nm. Experiments are performed on the 590 and 890 nm wavelength bands filtered from the SC spectrum. Results show distance measurements with standard deviations of around 0.01 mm at 50 m, and a distance-dependent component below 0.2 ppm on the individual spectral bands. Distance residuals compared to a reference interferometer are on the order of 0.1 ppm for displacements up to 50 m. Controlled pressure-induced refractivity variations are created over a length of 15 m, resulting in an optical path length change of 0.4 mm. Using the two-color method, we demonstrate refractivity-corrected distance measurement with a standard deviation of around 0.08 mm for a 60 s averaging window. The current experimental configuration can be easily extended to distance measurements on more than two wavelengths. The results highlight its potential for practical long-distance measurements through inline refractivity compensation.
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