2022
DOI: 10.1016/j.ndteint.2022.102711
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Phase estimation via riesz transform in laser speckle interferometry for large-area damage imaging

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Cited by 10 publications
(3 citation statements)
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“…2. Limited resolution: the resolution of LSI technology is limited by the size and propagation path of the laser spot, which is relatively low compared to other high-resolution imaging techniques, such as electron microscopy [51].…”
Section: Experimental Discussion Of Improved Angular Spectrum Methods...mentioning
confidence: 99%
“…2. Limited resolution: the resolution of LSI technology is limited by the size and propagation path of the laser spot, which is relatively low compared to other high-resolution imaging techniques, such as electron microscopy [51].…”
Section: Experimental Discussion Of Improved Angular Spectrum Methods...mentioning
confidence: 99%
“…Optical laser-based sensing methods, such as interferometric techniques like Moire´interferometry, holographic interferometry, speckle pattern interferometry, and sherography, enable remote full-field measurement of surface deformations and deformation gradients. 22 However, they generally require a coherent light source and very carefully controlled laboratory conditions, which limits their practicality for NDI/ SHM.…”
Section: Introductionmentioning
confidence: 99%
“…Optical methods offer a solution to these limitations since digital cameras can instantaneously image a surface with an array of sensors (pixels). Optical laser-based sensing methods such as interferometric techniques like Moire' interferometry, holographic interferometry, speckle pattern interferometry, and sherography enable remote full-field measurement of surface deformations and deformation gradients [9]. However, they generally require a coherent light source and very carefully controlled laboratory conditions, which limits their practicality for NDI/SHM.…”
Section: Introductionmentioning
confidence: 99%