2012
DOI: 10.1016/j.apsusc.2012.01.160
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Phase evolution in zirconia thin films prepared by pulsed laser deposition

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Cited by 16 publications
(5 citation statements)
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“…This is also another reason for the formation of tZrO 2 . A detailed study on phase evolution in zirconia films prepared from a sintered target containing two phase structure has been also recently reported by us [23].…”
Section: Discussionmentioning
confidence: 94%
See 1 more Smart Citation
“…This is also another reason for the formation of tZrO 2 . A detailed study on phase evolution in zirconia films prepared from a sintered target containing two phase structure has been also recently reported by us [23].…”
Section: Discussionmentioning
confidence: 94%
“…The details of the target sintering methods, their characterizations and substrate cleaning methods were already reported in previous publications [22,23]. A KrF excimer laser (Lambda Physik Compex-205, 248 nm wavelength) was used as the energy source to evaporate the targets for multilayer deposition.…”
Section: Methodsmentioning
confidence: 99%
“…However, UiO‐66‐NH 2 @Ti precursor can be transformed to their corresponding metal oxides after calcination. Consequently, diffraction peaks of ZrO 2 and TiO 2 can be identified, and the peaks at 25.7°,37.0°, 47.9°, 53.7°, and 55.0° can belong to the (101), (004), (200), (105), and (211) crystal planes of anatase TiO 2 (JCPDS 21‐1272), 35 whereas peaks value at 30.1°, 34.9°, 50.2°,60.2°, and 62.9° are ascribed to the (111), (200), (220), (121), and (202) crystal planes of ZrO 2 (JCPDS 50‐1089) 36 . Furthermore, the newly emerged peaks in the ZrO 2 @TiO 2 /Ag (green curve) at 38.20°, 44.40°, 64.60°, and 77.40° are attributed to the (111), Ag (200), Ag (220), and Ag (311) crystal planes of Ag (JCPDS 04‐0783).…”
Section: Resultsmentioning
confidence: 99%
“…The percent composition of each phase was calculated from the strongest peak intensity of the characteristic peak determined using software available with the equipment. 27 V γ = I γ(101) I γ(101) + I α(003) Surface morphologies were obtained using an FEI Quanta 250 FEG HRSEM with a field emission source and images using an Everhart-Thornley SE (secondary electron) detector with an electron accelerating voltage of 10 kV and a sample height of 10 mm. Sample for transmission electron microscopy (TEM) was prepared by a focused ion beam (FIB) instrument (FEI Strata 400s Dual Beam FIB), combined with a scanning electron beam and an ion beam.…”
Section: Methodsmentioning
confidence: 99%