Phase-Retrieval X-Ray Diffractometry in the Case of High- or Low-Flux Radiation Source

Abstract

An experimental‐analytical technique for X‐ray phase retrieval in the case of high‐ or low‐flux radiation source is considered. Experimentally measurable reflectivity magnitudes, using a rotating anode or conventional X‐ray tube source, affect the directly reconstructed profile of the complex crystal structure factor. Thermal and point defect diffuse scattering contaminates the tails of the Bragg diffracted intensity. A numerical procedure developed for the regularization of the directly reconstructed complex structure factor allows one to eliminate parasitic fringes in the resulting crystal‐lattice strain profiles. The stability of the phase‐reconstruction technique to experimental intensity measured in a different range of reflectivity values is discussed.

Application of the Phase-Retrieval X-Ray Diffractometry to an Ultra-High Spatial Resolution Mapping of SiGe Films near the Absorption Edge of Ge

“…To establish the origin of this observation we performed a normalization of the experimental intensity profile as [10] I IðQÞ R RðQÞ…”

“…For a distorted crystal, the normalised intensity has a fine structure, e.g. a modulation due to the SiGe Bragg diffraction peak [10]. This normalization was performed for all the collected data and showed systematic oscillations in the intensity profile (Figs.…”

“…[7,10]. The intensity profile that corresponds to these parasitic effects in the measured diffraction intensity profile is primarily determined by the radiation energy, E. For instance, diffuse scattering by point defects in solids has a morphology and location in reciprocal space which depends on the radiation energy [11].…”

Inhomogeneous microstrain in cylindrical semiconductor heterostructures and its influence on the adiabatic motion of electrons

“…2 is the detector angle with respect to the incident beam. The depth profile of the displacement of the original layer stack was calculated directly by the phase retrieval method 17,18 from synchrotron x-ray diffraction data. The synchrotron experiment was conducted on BL13XU at SPring-8.…”

High-resolution X-ray diffraction imaging of non-Bragg diffracting materials using phase retrieval X-ray diffractometry (PRXRD) technique

“…Inevitable background due to the electronics noise can be accounted for by the regularization procedure similar to the one described in detail in Ref. [27].…”