ABSTRACT:A detailed method is reported for deriving the lattice distortions and crystallite sizes of ultra-high molecular weight polyethylene (UHMWPE) fibers employing a full wide angle X-ray diffraction (W AXD) pattern. The predominant crystals are orthorhombic form and the refined unit cell dimensions for a and b are 7.40( ± 0.03) and 4.94( ± 0.03) A, respectively.The average crystallite size normal to 110 planes was found to be in the range of 163-182A. The microstrain lattice distortion was predominant in the gel-spun UHMWPE fibers, with the lattice constant variation of 0.5%.KEY WORDS Ultra-High Molecular Weight Polyethylene I Wide Angle X-Ray Diffraction I Paracrystalline Structure I Lattice Distortion I Crystallite Size I Microstrain IThe gel-spun ultra-high molecular weight polyethylene (UHMWPE) fibers have superior mechanical properties with the Young's modulus and tensile strength in the range of 100---220 GPa and 3-6 GPa, respectively. 1 Such superior mechanical properties are ascribed to the highly oriented and fully extended chains in the highly crystalline structure. The amount of non-crystalline domains is small, containing mainly chain entanglements, taut tie molecules, and chain ends. 2 The structure ofUHMWPE fibers has been extensively studied. 1 -20 Under ambient conditions, UHMWPE fibers mainly exhibit an orthorhombic crystalline structure with low levels of non-orthorhombic crystals. 2 -4 • 13 Structural transformations have been observed on UHMWPE fibers. Tension along the fiber axis and lateral compression have shown to cause crystal transformation from the orthorhombic to the monoclinic form. 6 • 10 At either high pressure or the temperature close to its melting point, the orthorhombic crystals go through a solid-state phase transformation to the pseudohexagonal crystals. 3,4,10 The crystallite sizes and lattice distortions in UHMWPE fibers are not as well understood. The wide angle X-ray diffraction (W AXD) peak widths are known to be closely associated with crystallite sizes. The analysis of peak width is, however, cumbersome owing to the scattering contributions of the amorphous halo and the overlapping of multiple reflections. Valid measurements of the crystallite sizes can only be made when peak overlaps can be properly resolved and separated from the background scatter. Determination of background scattering is the most difficult task and the methods chosen can lead to different results. For instance, crystallite sizes and lattice distortion of the same UHMWPE fibers were different depending upon whether a straight-line background 6 or the Fourier transform background 13 was used. Before the line broadening is computed, corrections for air scattering, white light radiation, sample absorption, Lorentz and polarization, and Compton factors have to be made. Likewise the instrumental broadening which arises from the finite width of the slits, thickness of the sample, divergence of the incident beam and the spectral distribution of energy in the incident radiation has to be eliminated.T...