2010
DOI: 10.1016/j.jallcom.2010.05.145
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Phase transformations of Fe73.5Cu1Nb3Si15.5B7 amorphous alloy upon thermal treatment

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Cited by 30 publications
(12 citation statements)
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“…The process of crystallization involves three well-defined broad asymmetric exothermic peaks (T k1 = 800 K, T k2 = 896 K and T k3 = 966 K) indicating a stepwise process of the structural transformations/crystallization of the alloy. XRD investigations of the as prepared Fe 73.5 Cu 1 Nb 3 Si 15.5 B 7 alloy confirmed the absence of long range ordering [2]. The FIB imaging conducted in combination with EDX and EBSD analysis confirmed the presence of Cu clusters and the formation of ␣-Fe-Si in the early stages of annealing.…”
Section: Resultsmentioning
confidence: 73%
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“…The process of crystallization involves three well-defined broad asymmetric exothermic peaks (T k1 = 800 K, T k2 = 896 K and T k3 = 966 K) indicating a stepwise process of the structural transformations/crystallization of the alloy. XRD investigations of the as prepared Fe 73.5 Cu 1 Nb 3 Si 15.5 B 7 alloy confirmed the absence of long range ordering [2]. The FIB imaging conducted in combination with EDX and EBSD analysis confirmed the presence of Cu clusters and the formation of ␣-Fe-Si in the early stages of annealing.…”
Section: Resultsmentioning
confidence: 73%
“…Our previous study [2], explains microstructural transformations upon annealing in more detail. It was found that structural composition remained unchanged up to 873 K, when formation of the crystalline phase FeCu 4 (ICDD-PDF 03-065-7002) started.…”
Section: Resultsmentioning
confidence: 92%
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“…Kurlyandskaya et al [10] used the XRD to analyze the texture features in soft nanocrystalline FeCrSiBNbCu alloys and for different compositions it was shown that stress annealing typically results in no texturing [36]. Figure 4 shows the XRD patterns of an FeCuNbSiB sample annealed at 973K studied by Gavrilovic et al [37] which revealed the different phases which become present after the sample has been subjected to the annealing process.…”
Section: X-ray Diffractionmentioning
confidence: 99%
“…Details of the interaction is captured by a detector. Because, we want the Gavrilovic et al [37]. information obtained to be accurate enough, samples are normally subjected to incident x-ray beams at different angles which results in different diffraction angles [34].…”
Section: Transmission X-ray Diffractionmentioning
confidence: 99%