IOSR
 2016
DOI: 10.9790/4861-0804042232
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Phase transition characteristics of (Ge4Sb4Te6) thin films using high resolution transmission electron microscope and optical properties

Z. S. El Mandouh1,
H. A. Zayed2,
Ahmed H. Hammad3
et al.

Abstract: Abstract:Thin amorphous films of (Ge4Sb4Te6)

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