2007
DOI: 10.1021/jp073671t
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Phase Transition of Individually Addressable Microstructured Membranes Visualized by Imaging Ellipsometry

Abstract: The phase transition of individually addressable microstructured lipid bilayers was investigated by means of imaging ellipsometry. Microstructured bilayers were created on silicon substrates by micromolding in capillaries, and the thermotropic behavior of various saturated diacyl phosphatidylcholine (1,2-dipalmitoyl-sn-glycero-3-phosphocholine, 1,2-dipentadecoyl-sn-glycero-3-phosphocholine, and 1,2-dimyristoyl-sn-glycero-3-phosphocholine (DMPC)) bilayers as well as DMPC/cholesterol membranes was determined by … Show more

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Cited by 39 publications
(48 citation statements)
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“…While the spatial resolution is limited by diffraction optics, the thickness-resolution is typically sub-nm. The technique has applications in semiconductor industries [23] and biology, particularly supported lipid bilayers [24, 25]. Imaging ellipsometry is a variant of the technique which spatially resolves thin films on the surface [26].…”
Section: Methods and Methodologymentioning
confidence: 99%
“…While the spatial resolution is limited by diffraction optics, the thickness-resolution is typically sub-nm. The technique has applications in semiconductor industries [23] and biology, particularly supported lipid bilayers [24, 25]. Imaging ellipsometry is a variant of the technique which spatially resolves thin films on the surface [26].…”
Section: Methods and Methodologymentioning
confidence: 99%
“…Experiments were performed with an Imaging Ellipsometer (EP 3 -SW, Nanofilm Technology, Göttingen, Germany) as described previously (Faiss et al, 2007;Gedig et al, 2008).…”
Section: Ellipsometrymentioning
confidence: 99%
“…Hydrophilic silica substrates were prepared according to Faiss et al (2007). After the silicon substrate was placed in the ellipsometric measuring cell the substrate was rinsed with PBS 5.9.…”
Section: Sample Preparationmentioning
confidence: 99%
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“…These parameters relate to polarization dependent optical reflectivities through a simple relation: tan ⌿e i⌬ = R p / R s , where R p and R s represent Fresnel reflectivities for p-and s-polarization, respectively. 42 Described in detail previously, 41,43 IE offers an attractive alternative to widely used fluorescence and atomic force microscopy ͑AFM͒, because of its many unique features. First, in imaging mode, ellipsometry takes advantage of the spatial differences in the optical properties of coexisting surface phases 44 making it a label-free method of investigation.…”
Section: Introductionmentioning
confidence: 99%