2017
DOI: 10.1063/1.5000137
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Photo-assisted Kelvin probe force microscopy investigation of three dimensional GaN structures with various crystal facets, doping types, and wavelengths of illumination

Abstract: Three dimensional GaN structures with different crystal facets and doping types have been investigated employing the surface photo-voltage (SPV) method to monitor illumination-induced surface charge behavior using Kelvin probe force microscopy. Various photon energies near and below the GaN bandgap were used to modify the generation of electron–hole pairs and their motion under the influence of the electric field near the GaN surface. Fast and slow processes for Ga-polar c-planes on both Si-doped n-type as wel… Show more

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Cited by 11 publications
(10 citation statements)
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“…The difference in the work function of the SKPM probe and the material was calculated using the following equations; e CPD= φ tip − φ sample where e is the charge, φ tip is the work function of the conducting probe and φ sample is the work function of the semiconductor material. 53 The topographic AFM images and the corresponding SKPM images of ZnO nanowires and ZnO@In 2 O 3 heterojunction nanowires before and during NO 2 exposure are shown in Fig. 6 .…”
Section: Resultsmentioning
confidence: 99%
“…The difference in the work function of the SKPM probe and the material was calculated using the following equations; e CPD= φ tip − φ sample where e is the charge, φ tip is the work function of the conducting probe and φ sample is the work function of the semiconductor material. 53 The topographic AFM images and the corresponding SKPM images of ZnO nanowires and ZnO@In 2 O 3 heterojunction nanowires before and during NO 2 exposure are shown in Fig. 6 .…”
Section: Resultsmentioning
confidence: 99%
“…Extended review papers on photovoltage phenomena and related characterizations "at the crossroads of physics, chemistry and electrical engineering" have been provided e.g by Shapira, 2001, 1999). Among commonly used experimental methods to evaluate the effect we can mention photo-assisted Kelvin probe spectroscopy (Ali Deeb et al, 2017), all-optical pump-probe absorption spectroscopies (Jana et al, 2014) and photoemission electron spectroscopies (Tanaka, 2012).…”
Section: Introductionmentioning
confidence: 99%
“…The KPFM measurements are performed under illumination to obtain a stable and reproducible signal. In the dark, random fast and slow charging and discharging processes at the surface turn the measurements unreliable 45,46 . Such processes are screened and stabilized under illumination.…”
Section: Discussionmentioning
confidence: 99%