1991
DOI: 10.2494/photopolymer.4.165
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Photo-degradation and electron beam-induced degradation of poly(pentamethyldisilylstyrene sulfone)s.

Abstract: Positive tone polysulfone resists have been studied extensively because they have weak C-S bond in the main chain upon UV light exposure. However, poly(olefin sulfone)s do not have UV absorption longer than 200 nm. The sensitivity of polysulfones as deep-UV resists can be endowed by incorporation of pendant aromatic ring into their structure. Organometallic polymers, primarily silicon-containing polymers are significantly interested in bilayer lithography because of the high oxygen plasma etch resistance. Poly… Show more

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