Abstract:Positive tone polysulfone resists have been studied extensively because they have weak C-S bond in the main chain upon UV light exposure. However, poly(olefin sulfone)s do not have UV absorption longer than 200 nm. The sensitivity of polysulfones as deep-UV resists can be endowed by incorporation of pendant aromatic ring into their structure. Organometallic polymers, primarily silicon-containing polymers are significantly interested in bilayer lithography because of the high oxygen plasma etch resistance. Poly… Show more
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