Photo-thermal quartz tuning fork excitation for dynamic mode atomic force microscope

Bontempi, Alexia; Teyssieux, Damien; Friedt, Jean‐Michel; Thiéry, Laurent; Hermelin, D.; Vairac, Pascal

doi:10.1063/1.4896784

Cited by 9 publications

(5 citation statements)

References 26 publications

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“…The second output is fed into a laser diode (5mW at 520nm) to emit a modulated laser beam. The beam, after focused by a 20×objective lens, is used to excite TF sidewards via photothermal effect [22,23], as shown in figure 1. Hence, the voltage signal from the second output of PLL is converted into an oscillating force applied to TF with the phase shifted by θ + π/2 with respect to x.…”

Section: Methodsmentioning

confidence: 99%

Calibrating conservative and dissipative response of electrically-driven quartz tuning forks

Hao

Wang

Peng

et al. 2016

Preprint

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Determining sensor parameters is a prerequisite for quantitative force measurement. Here we report a direct, high-precision calibration method for quartz tuning fork(TF) sensors that are popular in the field of nanomechanical measurement. In the method, conservative and dissipative forces with controlled amplitudes are applied to one prong of TF directly to mimic the tip-sample interaction, and the responses of the sensor are measured at the same time to extract sensor parameters. The method, for the first time, allows force gradient and damping coefficient which correspond to the conservative and dissipative interactions to be measured simultaneously. The calibration result shows surprisingly that, unlike cantilevers, the frequency shift for TFs depends on both the conservative and dissipative forces, which may be ascribed to the complex dynamics. The effectiveness of the method is testified by force spectrum measurement with a calibrated TF. The method is generic for all kinds of sensors used for non-contact atomic force microscopy(NC-AFM) and is an important improvement for quantitative nanomechanical measurement.

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Section: Methodsmentioning

confidence: 99%

Calibrating conservative and dissipative response of electrically-driven quartz tuning forks

Hao

Wang

Peng

et al. 2016

Preprint

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“…4(A) presents the general aspect of a probe developed for SThM applications. Here the use of a quartz tuning fork allows controlling the force when a contact between the tip and a sample occurs [33]. The thermocouple is embedded on a QTF prong and electrically connected to two electrodes previously disconnected from the QTF.…”

Section: Tested Sthm Probesmentioning

confidence: 99%

Calibration Tools for Scanning Thermal Microscopy Probes Used in Temperature Measurement Mode

Nguyen

Thiéry

Euphrasie

et al. 2019

Journal of Heat Transfer

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We demonstrate the functionality of a new active thermal microchip dedicated to the temperature calibration of scanning thermal microscopy (SThM) probes. The silicon micromachined device consists in a suspended thin dielectric membrane in which a heating resistor with a circular area of 50 μm in diameter was embedded. A circular calibration target of 10 μm in diameter was patterned at the center and on top of the membrane on which the SThM probe can land. This target is a resistive temperature detector (RTD) that measures the surface temperature of the sample at the level of the contact area. This allows evaluating the ability of any SThM probe to measure a surface temperature in ambient air conditions. Furthermore, by looking at the thermal balance of the device, the heat dissipated through the probe and the different thermal resistances involved at the contact can be estimated. A comparison of the results obtained for two different SThM probes, microthermocouples and probes with a fluorescent particle is presented to validate the functionality of the micromachined device. Based on experiments and simulations, an analysis of the behavior of probes allows pointing out their performances and limits depending on the sample characteristics whose role is always preponderant. Finally, we also show that a smaller area of the temperature sensor would be required to assess the local disturbance at the contact point.

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“…Here, the SThM probe used is based on a micro-thermocouple made of two welded wires and is operated in the so-called 2ω method 5 as an extension of Roh et al method. 6,7 Combined with the use of a quartz tuning fork, such a probe enables controlling the contact force 8 . It also represents an alternative to commercial resistive SThM probes 2 while allowing the tip apex temperature to be better mastered and the perturbative effect of the laser 9 that is observed when SThM is based on an AFM equipped with an optical system of contact force detection, to be avoided.…”

mentioning

confidence: 99%

“…Results are depicted in figure 7 where thermal contact conductance values are plotted with their uncertainty bars (standard uncertainty) as a function of thermal conductivity or its inverse. Resulting thermal contact conductances versus the samples thermal conductivity measured in ambient air.By combining expressions(8) to(11), the constants b 0 and  can be calculated:…”

mentioning

confidence: 99%

Calibration of thermocouple-based scanning thermal microscope in active mode (2ω method)

Nguyen

Thiéry

Euphrasie

et al. 2019

Review of Scientific Instruments

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We present a procedure dedicated to the calibration of a scanning thermal microscopy (SThM) probe operated in active mode and modulated regime especially for the measurement of solid material thermal conductivities. The probe used is a wire microthermocouple mounted on a quartz tuning fork (QTF). Measurements on reference samples are performed successively in vacuum and ambient air conditions revealing a clear difference in the dependence of the thermal interaction between the probe and the sample on the sample properties. Analytical modelling based on the resolution of the heat equation in the wire probe and a description of the thermal interaction using a network of thermal conductances are used to fit experimental data and analyse this difference. We have experimentally verified that the effective thermal contact radius of the probe tip depends on the sample thermal conductivity in ambient conditions whereas it remains constant in vacuum. We have defined the measurement range of the technique based on the decrease of the probe sensitivity at high thermal conductivities. Considering the experimental noise of our electrical device, it is shown that the maximum measurable value of thermal conductivity is near 23 Wm-1 K-1 in vacuum and 37 Wm-1 K-1 in ambient air conditions. Moreover, the lowest uncertainties are obtained for thermal conductivities below 5 Wm-1 K-1 typically. I. INTRODUCTION In parallel to the growing needs for localized characterization and knowledge improvement in the field of novel material development, scanning thermal microscopy (SThM) is nowadays a major tool for investigating heat transport at scale below one micrometer. Mainly based on an atomic force microscopy (AFM) system equipped with a miniaturized thermal probe, most of the SThM equipment can operate in

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Photo-thermal quartz tuning fork excitation for dynamic mode atomic force microscope

Cited by 9 publications

References 26 publications

Calibrating conservative and dissipative response of electrically-driven quartz tuning forks

Calibrating conservative and dissipative response of electrically-driven quartz tuning forks

Calibration Tools for Scanning Thermal Microscopy Probes Used in Temperature Measurement Mode

Calibration of thermocouple-based scanning thermal microscope in active mode (2ω method)

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