Photoabsorption cross section measurements of acetylene in the nonionizing region using the double-ion chamber method

Abstract

The double-ion chamber (DIC) method has been used to measure photoabsorption cross sections in the ionization region of the sample gas. In this study, we introduce a method to extend the wavelength region of the DIC measurements beyond the ionization threshold wavelength by using the photoion currents from the impurities in the sample gas. To verify this method, the photoabsorption cross sections of C2H2 (ionization threshold wavelength λth = 108.8 nm) have been measured from 105 to 137 nm. The natural impurity, acetone (λth = 127.8 nm), contained 1% in high-purity grade acetylene (C2H2) sample gas, allowing for measurements in the non-ionizing region of C2H2 up to 127.7 nm. By adding 1% benzene (λth = 134.6 nm) in the sample gas, measurements were possible even further, to 134.5 nm. This new method enables the measurement of the photoabsorption cross section by photoions that are produced from the impurities in the sample gas in a substantial amount. The current measurement methodology aligns well with the previous measurements of Suto and Lee [Suto and Lee, J. Chem. Phys. 80, 4824 (1984)].