Photoabsorption Properties in InAs Wire Structures Investigated by Dual Light Illumination Method in Scanning Tunneling Microscopy

Katsui, Shuichi; Takahashi, Takuji

doi:10.7567/jjap.50.08lb08

Jpn. J. Appl. Phys.

2011

DOI: 10.7567/jjap.50.08lb08

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Photoabsorption Properties in InAs Wire Structures Investigated by Dual Light Illumination Method in Scanning Tunneling Microscopy

Shuichi Katsui¹,

Takuji Takahashi²

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Photoabsorption Properties in InAs Wire Structures Investigated by Dual Light Illumination Method in Scanning Tunneling Microscopy

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