2011
DOI: 10.1016/j.jlumin.2011.02.006
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Photoactivation of silicon quantum dots

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Cited by 19 publications
(19 citation statements)
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“…13-14, and I(E g ) from Eqs. [16][17]. Finally, the sum over the N G(E) has been performed, forming the emission spectrum (i.e.…”
Section: Emissionmentioning
confidence: 99%
“…13-14, and I(E g ) from Eqs. [16][17]. Finally, the sum over the N G(E) has been performed, forming the emission spectrum (i.e.…”
Section: Emissionmentioning
confidence: 99%
“…Precipitation of excess Si in SiO 2 typically requires temperatures in the range 1000-1100 ∘ C for 1 h and produces Si-NCs with diameters between 3 to 7 nm [1,2]. Si-NCs exhibit a strong room temperature photoluminescence (PL) as a direct consequence of their small size, but nonradiative surface defects, as P b defect, compete with radiative process [3][4][5][6]. SiO 2 is an appropriate matrix for Si-NCs since it can passivate some dangling bonds that can cause nonradiative transitions.…”
Section: Introductionmentioning
confidence: 99%
“…However, a better control of surface defects on Si-NCs is valuable for light-emitting applications [3,6,7]. Annealing in molecular hydrogen can reduce the high concentration of surface defects, and then luminescence intensity from Si-NCs signi�catively increases [2][3][4][5][6][7][8]. It has been reported that a sample containing Si-NCs and passivated at 510 ∘ C in molecular hydrogen can increase its photoluminescence signal by a factor of seven [4].…”
Section: Introductionmentioning
confidence: 99%
“…As it is shown there, PL lifetime has increased in the sample with metal ion implantation. As mentioned in other works, this could be related to improving surface defects passivation on Si-NCs [4,7,[10][11][12][13]. Hydrogen depth profile of the sample with Ag implantation and its reference without it are shown in Figure 4(b).…”
Section: Resultsmentioning
confidence: 56%
“…The Pb defects, or dangling bonds, are known to cause quenching of the PL from Si-NCs [4][5][6]. Much research has been done to find a method to enhance the PL emission from a system of Si-NCs in SiO 2 by controlling the passivation of their surface defects by using gases such as hydrogen (H 2 ), nitrogen (N 2 ), or oxygen (O 2 ) [7][8][9][10][11][12][13][14]. It is well known that a thermal treatment in a molecular hydrogen-containing atmosphere increases the PL from Si-NCs more than Nitrogen or Oxygen [7].…”
Section: Introductionmentioning
confidence: 99%