OASLMs incorporating an a-Si:H photosensor and ferroelectric liquid crystal have proved their high performance in optoelectronic processing systems. The final step in their development is to establish a long mean time between failures, consistent responsivity, gain, resolution, and gray level response. Some subtle properties of the alignment layers, the liquid crystals, and the operating conditions create bottlenecks to producing consistently performing devices. We examine these bottleneck issues and explore ways to extend the reliabifity of device performance.